Design, process and performance diagnosis of InP-based photonic components using low-coherence reflectometry

Describes the high potential of optical low-coherence reflectometry (OLCR) and its upgraded in-situ facilities to assess the fabrication techniques of InP-based photonic circuits and also to help to optimize the design and further evaluate the performance of several key components (butt-joints, bend guides, MMI couplers, EAMs, DBR lasers, etc.,).