Implications of advanced microelectronics technologies for heavy ion single event effect (SEE) testing

The complexity of SEE testing for space applications, has increased over the years. This trend has been mainly driven by advances in integrated circuit technologies. This paper reviews how the test environment relates to the real space environment. It shows that medium energy beams (25 to 200 MeV/amu) are more and more necessary for SEE testing of state-of-the-art microcircuits.