A statistical sampler for increasing analog circuits observability

This paper presents a method of increasing the observability of analog circuits through the use of a statistical sampler. This sampler acquires statistical properties of the input signal. Its main advantages are simplicity, low analog area overhead and suitability for multi-channel acquisition, as only one-bit samplers are used. This qualifies it for use in a system-on-chip environment. The application of the statistical sampler to the test of analog circuits in a SOC environment is presented.