The Application of "Thru-Short-Delay" to the Calibration of the Dual Six-Port

In a companion paper, in this digest, a scheme for reducing the (single) six-port calibration problem to that of an equivalent four-port reflectometer has been described. This now makes it possible to apply existing four-port calibration schemes. One such method is the "thru-short-delay" (TSD) procedure. This paper briefly outlines this calibration approach.