Simulation of the recording process with a VSM on Co-Cr and Co-Ni-O layers deposited at oblique incidence

The recording process on Co-Cr and Co-Ni-O layers deposited at oblique incidence is simulated with a vibrating sample magnetometer. The Co-Cr layers are deposited on Si substrates and have an easy magnetization direction tilted 15 degrees from the normal to the layer, which is caused by the presence of columnar-shape anisotropy. The simulation experiments show that such a layer is more sensitive to one side of the perpendicular component of the write field of a ring head. The Co-Ni-O sample has an easy direction of magnetization tilted about 20 degrees out of the plane. The simulation experiments show that the steepness of the transition is different for the two directions of head movement.<
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