Imaging charge-coupled device (CCD) transient response to 17 and 50 MeV proton and heavy-ion irradiation

The results of irradiating a high-resolution, large-area, silicon charge-coupled device (CCD) imaging array (Kodak KAF-1400) with controlled low fluxes of collimated monoenergetic (17- and 50-MeV) protons and selected heavy ions are presented. The CCD response was measured at several angles of incidence, from normal to 70 degrees off normal, and at several azimuthal angles. The transient response events are recorded and analyzed to infer the effective charge collection depth of the CCD. Selected individual proton-induced events are analyzed for their two-dimensional spatial amplitude, and the results are compared to a charge collection model which included contributions from both the pixel depletion and diffusion volumes for the geometry (pixel size and spacing) and thickness (depletion depth and epitaxial layer thickness) of this CCD.<
>