Layout analysis to extract open nets caused by systematic failure mechanisms

Previously published work has pointed out that open defects are escaping test screens. To plug this hole, tests directed at nets susceptible to opens are required, and, therefore, nets susceptible to opens need to be identified. Opens caused by random particles have been modeled using weighted critical area (WCA) and have been previously studied. Here, we present a model that abstracts a class of systematic failure mechanisms that leads to open nets. An algorithm to calculate net scores using this model is presented. Experimental results on industrial designs show the algorithm to have reasonable performance.