The VLSI implementation of an artificial neural network scheme embedded in an automated inspection quality management system

This paper describes in detail the VLSI implementation of an innovative artificial neural network scheme embedded in an automated inspection system for the manufacturing industry employing the digital image processing techniques. An FPGA-based prototype which has been implemented and integrated with the recently developed automated inspection system, and a standard cell-based prototype which is under development in the laboratory utilizing several high performance integrated circuit design tools are also described in this paper.