Electrical and chemical characterization of thin epoxy layers for high voltage applications

In this work epoxy based, mineral filled, thin layers are studied. Results of broadband dielectric spectroscopy ranging from -150°C to 100°C and 0.01 Hz to 1 MHz are presented. Fourier transform infrared spectroscopy, scanning electron microscopy, energy-dispersive X-ray spectroscopy and also X-ray diffraction were used for chemical characterization of the materials. On the base of the results, proper material candidates can be selected for a desired application.