Synthesis of microwave and microcontroller equipment for particle size measurement

The paper discusses problems of particle size measurement on the basis of utilizing microwave and microcontroller equipment. Results of theoretical studies of reflectance properties of dielectric particles and current-conducting ones during electromagnetic-wave sounding of them are presented. Experimental results of particle diameter measurement in relation to electromagnetic oscillation frequency and incidence angle and acceptance one for reflected signals are demonstrated. The feasibility of using an information signal received during the acceptance of a reflected orthogonal-polarization signal is shown. A configuration scheme for microcontroller facilities for particle signal processing is proposed. Recommended practices for designing equipment for particle size measurement are given.