Towards metrological characterization of vector signal analyzers | IEEE Conference Publication | IEEE Xplore

Towards metrological characterization of vector signal analyzers


Abstract:

In the paper a way towards traceable calibration of the amplitude and phase response of a vector signal analyzer using digital real-time oscilloscope is outlined. Vector ...Show More

Abstract:

In the paper a way towards traceable calibration of the amplitude and phase response of a vector signal analyzer using digital real-time oscilloscope is outlined. Vector response of two different vector signal analyzers is measured. The method is compared with a method using digital sampling oscilloscope. The metrological traceability of measured results is discussed.
Date of Conference: 29 October 2012 - 01 November 2012
Date Added to IEEE Xplore: 11 February 2013
ISBN Information:
Conference Location: Amsterdam, Netherlands

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