Analysis of Various Types of SEU Data

This chapter contains sections titled:

• Critical Charge

• Depth and Critical Charge

• Charge Collection Mechanisms

• Charge Collection and the Cross-Section Curve

• Efficacy (Variation of SEU Sensitivity within a Cell)

• Mixed-Mode Simulations

• Parametric Studies of Device Sensitivity

• Influence of Ion Species and Energy

• Device Geometry and the Limiting Cross Section

• Track Size Effects

• Cross-Section Curves and the Charge Collection Processes

• Single Event Multiple-Bit Upset

• SEU in Logic Systems

• Transient Pulses