Collecting Diffraction Patterns with a Two-Phase Double-Rows Linear Array CCD Apparatus

Using a two-phase double-rows linear array CCD apparatus fitted up with a collecting card for special use, we collect and measure Frauhofer diffraction patterns formed by He-Ne laser through single slit and double slit. The principle, the experiment device and the adjustment requirements are introduced. Through comparing the measurement values with the theoretical values, we find this method has the advantage of precision besides quickness.