Combined TLP/RF testing system for detection of ESD failures in RF circuits

We present a modified TLP measurement system in which full functional RF testing, along with conventional leakage current measurement, is performed after each pulse to detect failure. Measurement results from 5-GHz LNAs show that RF metrics degrade before the leakage current increases. Also, we introduce an ESD-protected RF circuit for which leakage current measurements cannot be made, necessitating the use of other failure criteria.