Capacitively coupled transmission line pulsing CC-TLP – A traceable and reproducible stress method in the CDM-domain

This paper describes a new test method called Capacitively Coupled Transmission Line Pulsing cc-TLP. It is applied to different test circuits which were mounted on specially designed package emulators with a defined background capacitance. The test results are compared with the ESD thresholds obtained by CDM tests. The CC-TLP results correlate well with the CDM data.