Design for Testability

This chapter contains sections titled:

• Testability

• Ad Hoc Design for Testability Techniques

• Controllability and Observability by Means of Scan Registers

• Generic Scan-Based Designs

• Storage Cells for Scan Designs

• Classical Scan Designs

• Scan Design Costs

• Board-Level and System-Level DFT Approaches

• Some Advanced Scan Concepts

• Boundary-Scan Standards

This chapter contains sections titled:

• References

• Problems