Using FLIPPER to Predict Proton Irradiation Results for VIRTEX 2 Devices: A Case Study

The paper describes how FLIPPER can be used to analyze the SEU sensitivity of designs implemented by means of SRAM-based FPGAs by both fault injection and radiation testing. The comparison between fault injection experiment and proton testing on selected designs is presented in the paper. The excellent agreement represents a significant achievement toward the FLIPPER validation.