A Novel Test Pattern Generator with High Fault Coverage for BIST Design

A new and effective pseudorandom test pattern generator, termed GLFSR, is introduced. The test pattern generation by GLFSR achieves a higher degree of randomness. Experimental results on common benchmark CUT demonstrate that the fault coverage of the propose pattern generator is significantly higher compared to conventional pattern generation techniques. For Cutpsilas stuck-at fault and transition faults, test pattern generator using GLFSR can attain equivalent fault coverage but fewer patterns than LFSR pattern generator. GLFSR can be used as test pattern for the architecture of BIST.