Development of X-band Magnetic Resonance Force Microscopy

We report the modification of a X-band magnetic resonance force microscopy probe at our research center. We have newly developed a 3D(xyz)-piezo stage, which is made of titan, graphite, and commercial multilayer piezoelectric actuators. This piezo stage enables nanopositioning of a optical fiber and a sample at very low temperatures, and 3D scanning measurements. To achieve the higher spatial resolution, we have added the frequency stabilization system, which controls the microwave frequency within Deltaf ~100 kHz.