Approach to Extrapolating Reliability of Circuits Operating in a Varying and Low Temperature Range

We present an approach to extrapolating circuit reliability to use conditions with a varying and low temperature range. The approach integrates the impact of the statistical nature of transistor lifetime on circuit reliability to give a more realistic circuit reliability projection. Even though the approach is demonstrated for low temperature applications by focusing on hot carrier aging failure mechanism, it can be applied and easily extended to other failure mechanisms for any varying temperature operating conditions