Proposal of up-to-date standards on methods of measuring noise in linear two-ports

One of the most interesting topics for microwave community is the characterization of low-noise transistors. After so many years, the standards suggested by IEEE in 1960 are considered obsolete by the experimenters. A new methodology is proposed here as a standard. To support this proposal, an original measuring system for the complete characterization of microwave transistors in terms of noise, gain and scattering parameters from noise figure measurements only is presented.<
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