Abstract:
A test generation procedure for synchronous sequential circuits is proposed, that is based on the multiple observation times approach, and uses homing sequences, instead ...Show MoreMetadata
Abstract:
A test generation procedure for synchronous sequential circuits is proposed, that is based on the multiple observation times approach, and uses homing sequences, instead of conventionally used synchronizing sequences, to initialize the circuit. A procedure for computing homing sequences in sequential circuits, for which a state-table description is too large to be practical, is described, and experimental results are presented to demonstrate the effectiveness of the proposed test generation procedure.<>
Published in: IEEE Transactions on Computers ( Volume: 43, Issue: 5, May 1994)
DOI: 10.1109/12.280804