A simple statistical model of partial erasure in thin film disk recording systems

A simple statistical model of the partial erasure effect in metallic thin-film recording is given. Experimental data are shown and used to determine a fundamental parameter of the micromagnetic structure of the medium. This single parameter determines the extent of erasure at any transition separation. Since it has no (first-order) dependence on the rate of zigzags, it is anticipated that it will be relatively independent of the transition noise amplitude of the medium.<
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