Abstract:
A nine-valued circuit model for test generation is introduced which takes care of multiple and repeated effects of a fault in sequential circuits. Using this model test s...Show MoreMetadata
Abstract:
A nine-valued circuit model for test generation is introduced which takes care of multiple and repeated effects of a fault in sequential circuits. Using this model test sequences can be determined which allow multiple and repeated effects of faults on the internal state of a sequential circuit. Thus valid test sequences are derived where other known procedures, like the D-algorithm, do not find any test although one exists.
Published in: IEEE Transactions on Computers ( Volume: C-25, Issue: 6, June 1976)