XPAD : pixel detector for material sciences

Currently available 2D detectors do not make full use of the high flux and high brilliance of third generation synchrotron sources. XPAD prototype, using active pixels, has been developped to fullfill the needs of materials science scattering experiments. At the time, its prototype is build of 8 modules of 8 chips. The threshold calibration of ap 4times10
⁴
pixels is discussed. Applications to powder diffraction or SAXS experiments proof that it allows to record high quality data