Abstract:
When storage requirements or limits on test application time do not allow a complete (compact) test set to be used for a circuit, a partial test set that detects as many ...Show MoreMetadata
Abstract:
When storage requirements or limits on test application time do not allow a complete (compact) test set to be used for a circuit, a partial test set that detects as many faults as possible is required. Motivated by this application, we address the following problem. Given a test sequence T of length L for a synchronous sequential circuit and a length M
Published in: IEEE Transactions on Computers ( Volume: 53, Issue: 9, September 2004)
DOI: 10.1109/TC.2004.63