On maximizing the fault coverage for a given test length limit in a synchronous sequential circuit | IEEE Journals & Magazine | IEEE Xplore

On maximizing the fault coverage for a given test length limit in a synchronous sequential circuit


Abstract:

When storage requirements or limits on test application time do not allow a complete (compact) test set to be used for a circuit, a partial test set that detects as many ...Show More

Abstract:

When storage requirements or limits on test application time do not allow a complete (compact) test set to be used for a circuit, a partial test set that detects as many faults as possible is required. Motivated by this application, we address the following problem. Given a test sequence T of length L for a synchronous sequential circuit and a length M
Published in: IEEE Transactions on Computers ( Volume: 53, Issue: 9, September 2004)
Page(s): 1121 - 1133
Date of Publication: 19 July 2004

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