Electrical characterization of a high performance microprocessor socket for system level simulation

In this paper a novel electrical characterization methodology through measurement of a surface mount microprocessor socket is described. The measurement technique described here uses a de-embedding process and special test fixtures that ensures the extraction of the correct parasitic values of the socket pins. The measurements on the socket have been done in a very wide frequency bandwidth (45MHz to 10GHz) and the extraction of the equivalent circuits for the pins of the socket is presented in this work. The models have been successfully integrated and verified in a system level simulation, where the socket model has been integrated with a package model and a board model.