Testing of power connectors-influence of testing parameters

The basic principles of accelerated life testing of electrical contacts are discussed, with special emphasis on aging mechanisms and testing parameters. The testing parameters are described, and their influence on the aging behavior for a given connector type is evaluated. The influence on the aging characteristics of bolted Al/Cu high-current connectors by different testing parameters is studied. The parameters studied are current cycling, short circuits, current type (AC/DC), and current and temperature level. In addition, the influence of contact force on aging behavior is studied. It is concluded that all the parameters significantly influence the aging process. An important prerequisite for self-healing is a sufficiently high contact force, otherwise degradation mechanisms will dominate the aging. Thus it is important to test a specific connector type at its rated clamping force.<
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