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1671.1-2017/Cor 1-2023 - IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions - Corrigendum 1 | IEEE Standard | IEEE Xplore

1671.1-2017/Cor 1-2023 - IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions - Corrigendum 1

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Abstract:

Corrections to the XML Schema files to achieve full consistency with the text of the standard are addressed in this corrigendum. Additional files are also placed in the 1...Show More
Scope:This standard defines an exchange format, utilizing Extensible Markup Language (XML), for specifying test performance, test conditions, diagnostic requirements, and suppo...Show More

Abstract:

Corrections to the XML Schema files to achieve full consistency with the text of the standard are addressed in this corrigendum. Additional files are also placed in the 1671 directory here: https://standards.ieee.org/wp-content/uploads/2024/04/1671.1-2017-cor1-2023-downloads.zip
Scope:
This standard defines an exchange format, utilizing Extensible Markup Language (XML), for specifying test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a unit under test (UUT). This is in support of the life cycle of test program sets (TPSs) that will be used in an automatic test environment.
Date of Publication: 26 April 2024
Electronic ISBN:979-8-8557-0693-2
Persistent Link: https://ieeexplore.ieee.org/servlet/opac?punumber=10508764

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