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Efficient algorithms for system diagnosis with both processor and comparator faults
Chen, Y.; Bucken, W.; Echtle, K.;
Parallel and Distributed Systems, IEEE Transactions on
Volume 4,
Issue 4,
April 1993
Page(s):371
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381
Abstract:
For the comparison-based self-diagnosis of multiprocessor systems, an extended model that considers both processor and comparator faults is presented. It is shown that in this model the system diagnosability is t⩽Zδ/2Z, where δ is the minimum vertex degree of the system graph. However, if the number of faulty comparators is assumed not to exceed the number of faulty processors, the diagnosability of the model reaches t⩽δ. An optimal O(|E|) algorithm, where E is the set of comparators, is given for identifying all faulty processors and comparators, provided that the total number of faulty components does not exceed the system diagnosability, and an O(|E|)2 algorithm for the case t⩽δ is also presented. These efficient algorithms determine the faulty processors by calculating each processor's weight, which is mainly defined by the number of adjacent relative tests stating `agreement'. After sorting the processors according to their weights, the algorithms determine all faulty components by separating the sorted processor list
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