Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
CrossRef Search
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
You requested this document:
1. Design of a 2-GS/s 8-b self-calibrating ADC in 0.18 μm CMOS technology
Azzolini, C.; Boni, A.; Facen, A.; Parenti, M.; Vecchi, D.;
Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
23-26 May 2005 Page(s):1386 - 1389 Vol. 2
Abstract:

The paper discusses the design of a very highspeed 8-b analog-to-digital converter (ADC) in 0.18-μm CMOS. A conversion rate as high as 2GS/s with a relatively low power consumption was achieved by means of a couple of interleaved subranging/flash ADC with a single track-and-hold at the input. Special design solutions were adopted for implementing subranging operation at such a high frequency. Finally, a lower power consumption self-calibrating technique effective for reducing nonlinearity errors below 1 LSB was implemented.
Abstract | Full Text: PDF(160 KB)    IEEE CNF
 
» Key
IEEE JNL IEEE Journal or Magazine
IEE JNL IEE Journal or Magazine
IEEE CNF IEEE Conference Proceeding
IEE CNF IEE Conference Proceeding
IEEE STD IEEE Standard
 
 
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved