Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_left View Search Results  
Email/Printer Friendly Format  
 

ALAN: A (Circuit-Switched) Local Area Network

Hailpern, B.   Heller, A.   Hoevel, L.   Thefaine, Y.  
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
This paper appears in: Selected Areas in Communications, IEEE Journal on
Publication Date: May 1985
Volume: 3 , Issue: 3
On page(s): 427 - 430
ISSN: 0733-8716
Current Version Published: 2003-01-06

Abstract
Our view is that people (that is, programmers and general computer users) tend to work together in small groups, where information and resources are shared freely within a group. Most interactions occur within the group (called a cluster)-sending messages, exchanging data, sharing a printer. Communication outside the cluster-sending mail to someone in another group or using a large number cruncher-is comparalively rare. Under this hypothesis, it is advantageous to optimize and simplify interactions within the group. This paper describes our attempt to design a cluster network based on a nonblocking crosspoint switch, which we call ALAN (a local area net). ALAN clusters are star-connected-with intelligent workstation nodes (PC's) at the points of the star, and the ALAN switch at the center.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text PDF icon
Full Text: PDF (480 KB)
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Rights and Permissions>
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_left View Search Results  
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved