Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_left View Search Results  
Email/Printer Friendly Format  
 

Microwave magnetic field effects on high-power microwave window breakdown

Hemmert, D.   Neuber, A.A.   Dickens, J.   Krompholz, H.   Hatfield, L.L.   Kristiansen, M.  
Dept. of Electr. Eng. & Phys., Texas Tech. Univ., Lubbock, TX, USA;
This paper appears in: Plasma Science, IEEE Transactions on
Publication Date: June 2000
Volume: 28 , Issue: 3
On page(s): 472 - 477
ISSN: 0093-3813
Digital Object Identifier: 10.1109/27.887650
Current Version Published: 2002-08-06

Abstract
Microwave window breakdown in vacuum is investigated for an idealized geometry, where a dielectric slab is located in the center of a rectangular waveguide with its normal parallel to the microwave direction of propagation. An S-band resonant ring with a frequency of 2.85 GHz and a power of 60 MW is used. With field enhancement tips at the edges of the dielectric slab, the threshold power for breakdown is observed to be dependent on the direction of the microwaves; i.e., it is approximately 20% higher for the downstream side of the slab than it is for the upstream side. Simple trajectory calculations of secondary electrons in an RF field show a significant forward motion of electrons parallel to the direction of microwave propagation. Electrons participating in a saturated secondary avalanche on the upstream side are driven into the surface, and electrons on the downstream side are driven off the surface, because of the influence of the microwave magnetic field. In agreement with the standard model of dielectric surface flashover for dc conditions (saturated avalanche and electron-induced outgassing), the corresponding change in the surface charge density is expected to be proportional to the applied breakdown threshold electric field parallel to the surface

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text PDF icon
Full Text: PDF (204 KB)
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Rights and Permissions>
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_left View Search Results  
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved