Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_left View Search Results  
Email/Printer Friendly Format  
 

Equivalence between local exponential stability of the unique equilibrium point and global stability for Hopfield-type neural networks with two neurons

Xue-Bin Liang  
Dept. of Comput. Sci., Fudan Univ., Shanghai, China;
This paper appears in: Neural Networks, IEEE Transactions on
Publication Date: Sept. 2000
Volume: 11 , Issue: 5
On page(s): 1194 - 1196
ISSN: 1045-9227
Digital Object Identifier: 10.1109/72.870051
Current Version Published: 2002-08-06

Abstract
Fang and Kincaid (1996) proposed an open problem about the relationship between the local stability of the unique equilibrium point and the global stability for a Hopfield-type neural network with continuously differentiable and monotonically increasing activation functions. As a partial answer to the problem, in the two-neuron case it is proved that for each given specific interconnection weight matrix, a Hopfield-type neural network has a unique equilibrium point which is also locally exponentially stable for any activation functions and for any other network parameters if and only if the network is globally asymptotically stable for any activation functions and for any other network parameters. If the derivatives of the activation functions of the network are bounded, then the network is globally exponentially stable for any activation functions and for any other network parameters

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text PDF icon
Full Text: PDF (120 KB)
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Rights and Permissions>
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_left View Search Results  
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved