Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_left View Search Results  
Email/Printer Friendly Format  
 

Design of real-time image enhancement preprocessor for CMOS image sensor

Yun Ho Jung   Jae Seok Kim   Bong Soo Hur   Moon Gi Kang  
Dept. of Electron. Eng., Yonsei Univ., Seoul, South Korea;
This paper appears in: Consumer Electronics, IEEE Transactions on
Publication Date: Feb. 2000
Volume: 46 , Issue: 1
On page(s): 68 - 75
ISSN: 0098-3063
Digital Object Identifier: 10.1109/30.826383
Current Version Published: 2002-08-06

Abstract
This paper presents a design of the real-time digital image enhancement preprocessor for a CMOS image sensor. The CMOS image sensor offers various advantages while it provides lower-quality images than the CCD does. In order to compensate for the physical limitation of the CMOS sensor, a spatially adaptive contrast enhancement algorithm was incorporated into the preprocessor with color interpolation, gamma correction, and automatic exposure control. The efficient hardware architecture for the preprocessor is proposed and was simulated in VHDL. It is composed of about 19 K logic gates, which is suitable for a low-cost one-chip PC camera. The test system was implemented on a FPGA chip in real-time mode, and performed successfully

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text PDF icon
Full Text: PDF (272 KB)
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Rights and Permissions>
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_left View Search Results  
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved