Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_left View Search Results  
Email/Printer Friendly Format  
 

Fault-tolerant rank order filtering for image enhancement

Jai-Hoon Kim   Sungsoo Kim   Lombardi, F.  
Div. of Inf. & Comput. Eng., Ajou Univ., Suwon , South Korea;
This paper appears in: Consumer Electronics, IEEE Transactions on
Publication Date: May 1999
Volume: 45 , Issue: 2
On page(s): 436 - 442
ISSN: 0098-3063
Digital Object Identifier: 10.1109/30.793429
Current Version Published: 2002-08-06

Abstract
This paper presents an approach for the fault-tolerant computation of the rank order filtering on a SIMD (single instruction multiple data) mesh processor. The proposed approach improves over a previous approach in two respects: by changing the data dependency in the execution of the rank order filtering, a new algorithm with constant execution time complexity can be designed; and by introducing a dependency for the rank values of faulty processing elements (PEs) as computed by neighboring (fault free) PEs, a lower distortion can be achieved for the image enhancement. An algorithm is presented; this algorithm is based on a two-phase technique in which the rank corresponding to each faulty PE is computed by a selected fault free PE. The effect of the rank computation for a faulty PE is restricted within a window of the image, such that no significant overhead is accounted for in execution complexity. This results in a considerable improvement in speed-up ratio, fault-tolerance as well as a lower distortion in the reconstructed image. The proposed approach is also evaluated using experimental results. As the proposed algorithm is directly compatible with a SIMD mesh execution, a discussion of the communication constructs and switching architecture to support array processing is also presented

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text PDF icon
Full Text: PDF (912 KB)
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Rights and Permissions>
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_left View Search Results  
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved