Hubing, T.
Drewniak, J.
Van Doren, T.
Kashyap, N.
Electromagn. Compatibility Lab., Missouri Univ., Rolla, MO, USA;
This paper appears in: Electromagnetic Compatibility, 1996. Symposium Record. IEEE 1996 International Symposium on Publication Date: 19-23 Aug. 1996
On page(s):
200
- 203
Meeting Date: 08/19/1996
- 08/23/1996
Location: Santa Clara, CA
ISBN: 0-7803-3207-5
Digital Object Identifier: 10.1109/ISEMC.1996.561228
Current Version Published: 2002-08-06
Abstract
Existing computer software for EMC analysis can be divided into three categories: analytical modeling codes employ closed form expressions to solve problems of general interest to EMC engineers or circuit designers; numerical modeling codes use numerical techniques to solve Maxwell's equations subject to specific boundary conditions; and EMC rule checkers search a design for features that violate basic EMC design guidelines. This paper outlines the relative advantages and limitations of each of these three approaches and describes an expert system EMC modeling approach. The new approach combines analytical models, numerical models, and EMC rule-checking in order to evaluate designs in much the same way that an EMC expert would
Index
Terms
Available to subscribers and IEEE members.
References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not
logged in.
Guests
may access Abstract records free of charge.
Cart
