A set-based mapping strategy for flash-memory reliability enhancement
Yuan-Sheng Chu
Jen-Wei Hsieh
Yuan-Hao Chang
Tei-Wei Kuo
Wireless Commun. BU, MediaTek Inc.
This paper appears in: Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09. Publication Date: 20-24 April 2009
On page(s):
405
- 410
Location: Nice
ISSN: 1530-1591
ISBN: 978-1-4244-3781-8
Current Version Published: 2009-06-23
Abstract
With wide applicability of flash memory in various application domains, reliability has become a very critical issue. This research is motivated by the needs to resolve the lifetime problem of flash memory and a strong demand in turning thrown-away flash-memory chips into downgraded products. We proposes a set-based mapping strategy with an effective implementation and low resource requirements, e.g., SRAM. A configurable management design and wear-leveling issue are considered. The behavior of the proposed method is also analyzed with respect to popular implementations in the industry.We show that the endurance of flash memory can be significantly improved by a series of experiments over a realistic trace. Our experiments show that the read performance is even largely improved.
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