Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_left View Search Results  
Email/Printer Friendly Format  
 

Automatic Estimation and Removal of Noise from a Single Image

Ce Liu   Szeliski, R.   Sing Bing Kang   Zitnick, C.L.   Freeman, W.T.  
Massachusetts Inst. of Technol., Cambridge
This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Feb. 2008
Volume: 30 , Issue: 2
On page(s): 299 - 314
ISSN: 0162-8828
Digital Object Identifier: 10.1109/TPAMI.2007.1176
Current Version Published: 2007-12-18

Abstract
Image denoising algorithms often assume an additive white Gaussian noise (AWGN) process that is independent of the actual RGB values. Such approaches cannot effectively remove color noise produced by today's CCD digital camera. In this paper, we propose a unified framework for two tasks: automatic estimation and removal of color noise from a single image using piecewise smooth image models. We introduce the noise level function (NLF), which is a continuous function describing the noise level as a function of image brightness. We then estimate an upper bound of the real NLF by fitting a lower envelope to the standard deviations of per-segment image variances. For denoising, the chrominance of color noise is significantly removed by projecting pixel values onto a line fit to the RGB values in each segment. Then, a Gaussian conditional random field (GCRF) is constructed to obtain the underlying clean image from the noisy input. Extensive experiments are conducted to test the proposed algorithm, which is shown to outperform state-of-the-art denoising algorithms.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text PDF icon
Full Text: PDF (5424 KB)
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Rights and Permissions>
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_left View Search Results  
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved