Abstract
Through the use of terahertz time-domain spectroscopy (THz-TDS), the sample thickness can be determined by exploiting the Fabry-Perot effect. Given the reference pulse and the full-scanned sample pulse traversing a homogeneous dielectric material with a known index of refraction, the method calculates the thickness from the fringe pattern, i.e. the maxima and minima, appearing in the transmission amplitude spectrum. High accuracy is attainable when a material has a constant index of refraction and low loss across the T-ray frequency region. This paper demonstrates results using silicon and cycloolefines as test material.
Index
Terms
Available to subscribers and IEEE members.
References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not
logged in.
Guests
may access Abstract records free of charge.
Cart
