Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_left View Search Results  
Email/Printer Friendly Format  
 

Wavelet Footprints and Sparse Bayesian Learning for DNA Copy Number Change Analysis

Pique-Regi, R.   En-Shuo Tsau   Ortega, A.   Seeger, R.   Asgharzadeh, S.  
Dept. of Electr. Eng., Univ. of Southern California, CA
This paper appears in: Acoustics, Speech and Signal Processing, 2007. ICASSP 2007. IEEE International Conference on
Publication Date: 15-20 April 2007
Volume: 1
On page(s): I-353 - I-356
Location: Honolulu, HI
ISSN: 1520-6149
ISBN: 1-4244-0727-3
Digital Object Identifier: 10.1109/ICASSP.2007.366689
Current Version Published: 2007-06-04

Abstract
Alterations in the number of DNA copies are very common in tumor cells and may have a very important role in cancer development and progression. New array platforms provide means to analyze the copy number by comparing the hybridization intensities of thousands of DNA sections along the genome. However, detecting and locating the copy number changes from this data is a very challenging task due to the large amount of biological processes that affect hybridization and cannot be controlled. This paper proposes a new technique that exploits the key characteristic that the DNA copy number is piecewise-constant along the genome. First, wavelet footprints are used to obtain a basis for representing the DNA copy number that is maximally sparse in the number of copy number change points. Second, sparse Bayesian learning is applied to infer the copy number changes from noisy array probe intensities. Results demonstrate that sparse Bayesian learning has better performance than matching pursuits methods for this high coherence dictionary. Finally, our results are also shown to be very competitive in performance as compared to state-of-the-art methods for copy number detection.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text PDF icon
Full Text: PDF (371 KB)
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Rights and Permissions>
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_left View Search Results  
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved