Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_left View Search Results  
Email/Printer Friendly Format  
 

LP Decoding Corrects a Constant Fraction of Errors

Feldman, J.   Malkin, T.   Servedio, R. A.   Stein, C.   Wainwright, M. J.  
Dept. of Ind. Eng. & Oper. Res., Columbia Univ., New York, NY
This paper appears in: Information Theory, IEEE Transactions on
Publication Date: Jan. 2007
Volume: 53 , Issue: 1
On page(s): 82 - 89
ISSN: 0018-9448
Digital Object Identifier: 10.1109/TIT.2006.887523
Current Version Published: 2006-12-26

Abstract
We show that for low-density parity-check (LDPC) codes whose Tanner graphs have sufficient expansion, the linear programming (LP) decoder of Feldman, Karger, and Wainwright can correct a constant fraction of errors. A random graph will have sufficient expansion with high probability, and recent work shows that such graphs can be constructed efficiently. A key element of our method is the use of a dual witness: a zero-valued dual solution to the decoding linear program whose existence proves decoding success. We show that as long as no more than a certain constant fraction of the bits are flipped by the channel, we can find a dual witness. This new method can be used for proving bounds on the performance of any LP decoder, even in a probabilistic setting. Our result implies that the word error rate of the LP decoder decreases exponentially in the code length under the binary-symmetric channel (BSC). This is the first such error bound for LDPC codes using an analysis based on "pseudocodewords." Recent work by Koetter and Vontobel shows that LP decoding and min-sum decoding of LDPC codes are closely related by the "graph cover" structure of their pseudocodewords; in their terminology, our result implies that that there exist families of LDPC codes where the minimum BSC pseudoweight grows linearly in the block length

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text PDF icon
Full Text: PDF (279 KB)
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Rights and Permissions>
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_left View Search Results  
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved