Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_left View Search Results  
Email/Printer Friendly Format  
 

Rapid charger for high repetition rate pulse generator

Kuthi, A.   Young, C.   Fei Wang   Wijetunga, P.   Gundersen, M.  
Dept. of Electr. Eng. - Electrophys., Southern California Univ., Los Angeles, CA, USA
This paper appears in: Pulsed Power Conference, 2003. Digest of Technical Papers. PPC-2003. 14th IEEE International
Publication Date: 15-18 June 2003
Volume: 2
On page(s): 950 - 952 Vol.2
ISSN:
ISBN: 0-7803-7915-2
Current Version Published: 2004-03-30

Abstract
The design and operation of a command resonant charger feeding a high repetition rate pulse generator using an advanced pseudospark device is presented. An application - corona assisted flame ignition and combustion - is discussed briefly. This application requires operation of the pseudospark switch at 30 kV charging voltage and 1 kHz repetition rate. The charging time of the 6 nF / 30 kV quasi Blumlein pulse forming circuit capacitance is 50 μs. Operation is burst mode, with maximum 100 pulses per burst.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text PDF icon
Full Text: PDF (292 KB)
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Rights and Permissions>
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_left View Search Results  
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved