Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_left View Search Results  
Email/Printer Friendly Format  
 

The development of a closed-form expression for the input impedance of power-return plane structures

Minjia Xu   Hubing, T.H.  
Hewlett Packard, San Diego, CA, USA
This paper appears in: Electromagnetic Compatibility, IEEE Transactions on
Publication Date: Aug. 2003
Volume: 45 , Issue: 3
On page(s): 478 - 485
ISSN: 0018-9375
Digital Object Identifier: 10.1109/TEMC.2003.815531
Current Version Published: 2003-08-26

Abstract
In multilayer printed circuit boards, the noise on the power bus is influenced by the impedance between the power and ground planes. Power-bus noise estimates require an accurate estimate of the power-bus input impedance. This paper develops a closed-form estimate of the input impedance for circular power-return plane structures. When the structure is lossy (e.g., boards employing embedded capacitance or densely populated boards), the energy reflected from the board edge does not significantly affect the input impedance. In general, the expressions developed here for circular structures can be used to estimate the impedance of lossy power-return plane structures of any shape.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text PDF icon
Full Text: PDF (620 KB)
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Rights and Permissions>
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_left View Search Results  
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved