Abstract
Repetitive pulsed-power generators with nanosecond rise times and multi-kilovolt outputs commonly employ silicon MOSFET switches. Gallium arsenide FET switches hold the promise of faster operation, higher voltage hold-off, and greater current densities. The realization of this promise requires an understanding of the physical and practical limits of Si- and GaAs-based devices. In this paper, the results of ATLAS simulations on a Si MOSFET and on a GaAs SIT are presented. The results show that GaAs-based devices are superior to those based on Si in terms of switching speeds and power dissipation, but that they have a relatively higher leakage current.
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