Ranganathan, S.
Beetner, D.G.
Wiese, R.
Hubing, T.H.
Missouri Univ., Rolla, MO, USA
This paper appears in: Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on Publication Date: 19-23 Aug. 2002
Volume: 2
On page(s):
976
- 981 vol.2
Location: Minneapolis, MN, USA
ISBN: 0-7803-7264-6
Digital Object Identifier: 10.1109/ISEMC.2002.1032828
Current Version Published: 2002-11-07
Abstract
Improving EMC in automobiles requires methods to detect potential problems early in the design process. Issues involved in the development of a system-level automotive EMC expert system are explored. The proposed system would help identify problems with radiation and immunity, crosstalk, placement of modules, component grounding and EMC testing. The architecture of the expert system has been developed. The system architecture is designed to allow rapid analysis of automobile designs, to point out potential problems and to suggest possible solutions.
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