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		<title><![CDATA[ Very Large Scale Integration (VLSI) Systems, IEEE Transactions on - new TOC ]]></title>
		<link>http://ieeexplore.ieee.org</link>
		<description>TOC Alert for Publication# 92 </description>
		<year>2012</year>
		<month>February </month>
		<day>10</day>
		<item>
			<title><![CDATA[Table of Contents]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=6129940]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=6129940]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>C1</startPage>
			<endPage>C4</endPage>
			<fileSize>145</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[IEEE Transactions on Very Large Scale Integration (VLSI) Systems publication information]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=6129943]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=6129943]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>C2</startPage>
			<endPage>C2</endPage>
			<fileSize>40</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[UHF Receiver Front-End: Implementation and Analog Baseband Design Considerations]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5678608]]></link>
			<description><![CDATA[An integrated ultrahigh-frequency (UHF) receiver is presented. A systematic analysis to quantify the interdependence of baseband filter and analog-to-digital converter (ADC) dynamic range in broadband receivers is presented. This analysis shows that: (1) low-order Butterworth filters are favorable when undesired power is dominated by far out blockers and (2) high-order inverse Chebyshev filters can reduce the resolution of a subsequent ADC by up to two additional bits in the presence of adjacent analog narrowband blockers. Based on the analysis, a cascaded, programmable, hybrid active-RC and switched-capacitor (SC) baseband filter is proposed. An all-digital nonoverlap clock tuning system to minimize the variation of available settling time window in SC circuits is also proposed. The receiver integrates the proposed filter with an RF variable gain amplifier (RFVGA) and a passive mixer. This receiver achieves a measured noise figure of 7.9 dB, an IIP3 of -8 dBm at maximum gain and +2 dBm at 9-dB RF attenuation. The chip consumes 120 mW (RFVGA, mixer and I-channel baseband) from 1.8-V analog/2.5-V digital dual supply and occupies 2.14 mm<sup>2</sup> in IBM 0.18-&#x03BC;m RF CMOS technology.]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5678608]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>197</startPage>
			<endPage>210</endPage>
			<fileSize>2696</fileSize>
			<authors><![CDATA[Kulkarni, R.;Jusung Kim;Hyung-Joon Jeon;Jianhong Xiao;Silva-Martinez, J.;]]></authors>
		</item>
		<item>
			<title><![CDATA[General Parameterized Thermal Modeling for High-Performance Microprocessor Design]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5696798]]></link>
			<description><![CDATA[This paper proposes a new parameterized dynamic thermal modeling algorithm for emerging thermal-aware design and optimization for high-performance microprocessor design at architecture and package levels. Compared with existing behavioral thermal modeling algorithms, the proposed method can build the compact models from more general transient power and temperature waveforms used as training data. Such an approach can make the modeling process much easier and less restrictive than before and, thus, more amenable for practical measured data. The new method, called ParThermSID, consists of two steps. First, the response surface method based on second-order polynomials is applied to build the parameterized models at each time point for all of the given sampling nodes in the parameter space. Second, an improved subspace system identification method, called ThermSID, is employed to build the discrete state space models, by construction of the Hankel matrix and state space realization, for each time-varying coefficient of the polynomials generated in the first step. To overcome the overfitting problems of the subspace method, the new method employs an overfitting mitigation technique to improve model accuracy and predictive ability. Experimental results on a practical quad-core microprocessor show that the generated parameterized thermal model matches the given data very well. The compact models generated by ParThermSID also offer two orders of magnitude speedup over the commercial thermal analysis tool FloTHERM on the given example. The results also show that ThermSID is more accurate than the existing ThermPOF method.]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5696798]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>211</startPage>
			<endPage>224</endPage>
			<fileSize>2086</fileSize>
			<authors><![CDATA[Eguia, T.J.;Tan, S.X.-D.;Ruijing Shen;Duo Li;Pacheco, E.H.;Tirumala, M.;Lingli Wang;]]></authors>
		</item>
		<item>
			<title><![CDATA[Analyzing Potential Throughput Improvement of Power- and Thermal-Constrained Multicore Processors by Exploiting DVFS and PCPG]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5708196]]></link>
			<description><![CDATA[Process variability from a range of sources is growing as technology is scaled below 65 nm, increasing variations of transistor delay and leakage current both within a die and across dies. This, in turn, negatively impacts maximum operating frequency and total power consumption of processors. Meanwhile, manufacturers have integrated more cores in a single die to improve the throughput of processors running highly-parallel workloads. However, many existing workloads do not have high enough parallelism to exploit multiple cores in a processor. First, in this paper, we maximize the throughput of power- and thermal-constrained multicore processors using per-core power gating and dynamic voltage/frequency scaling. When we do not have enough parallelism to effectively use all cores, we turn off some cores using per-core power gates that are already available in commercial multicore processors. This provides extra power and thermal headroom, and allows active cores to run faster through voltage/frequency scaling within power, thermal, and voltage scaling limits. Our analysis using a 32 nm predictive technology model demonstrates that jointly optimizing the number of active cores and maximum operating frequency can improve the throughput of a 16-core processor running workloads with limited parallelism by up to 14%. Second, we extend our throughput analysis and optimization to consider the impact of within-die spatial process variations that lead to considerable core-to-core frequency and leakage power variations in multicore processors. Our analysis shows that exploiting core-to-core frequency variations can improve the throughput of a 16-core processor by up to 57%.]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5708196]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>225</startPage>
			<endPage>235</endPage>
			<fileSize>1083</fileSize>
			<authors><![CDATA[Jungseob Lee;Nam Sung Kim;]]></authors>
		</item>
		<item>
			<title><![CDATA[Testable Path Selection and Grouping for Faster Than At-Speed Testing]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5686903]]></link>
			<description><![CDATA[Faster than at-speed testing provides an efficient way for testing of small delay defects (SDDs). It requires test patterns to be delicately classified into groups according to the delay of sensitized paths. Each group of patterns is managed to be applied at certain frequency. In this paper, we propose to generate tests for faster than at-speed testing based on path delay fault (PDF) model and single path sensitization criterion. An effective testable path selection and grouping method is introduced, which could quickly and accurately identify paths whose delay falls into a given delay span. Several techniques are used to improve the efficiency of the testable path selection procedure. Experimental results on ISCAS'89 benchmark circuits show that the proposed method could achieve high transition fault coverage and high test quality of SDDs with low CPU time.]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5686903]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>236</startPage>
			<endPage>247</endPage>
			<fileSize>1365</fileSize>
			<authors><![CDATA[Xiang Fu;Huawei Li;Xiaowei Li;]]></authors>
		</item>
		<item>
			<title><![CDATA[Soft-Error-Resilient FPGAs Using Built-In 2-D Hamming Product Code]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5682391]]></link>
			<description><![CDATA[Radiation-induced soft error rate (SER) degrades the reliability of static random access memory (SRAM)-based field programmable gate arrays (FPGAs). This paper presents a new built-in 2-D Hamming product code (2-D HPC) scheme to provide reliable operation of SRAM-based FPGAs in hostile operating environments such as space. Multibit error correction capability of our built-in 2-D HPC can improve the reliability, and hence, system availability, by orders of magnitude. Simulation results show that the large number of error correction capability of 2-D HPC can recover configuration bits without depending on an external memory preserving a golden copy of the configuration bits. To provide efficient 2-D HPC in a built-in logic, we also propose a new 2-D SRAM buffer. Using the proposed multibit error correction scheme, system availability of an SRAM-based FPGA can be more than 99.9999999% with SRAM cell failures in 1 billion h of operation of 7.]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5682391]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>248</startPage>
			<endPage>256</endPage>
			<fileSize>1066</fileSize>
			<authors><![CDATA[Sang Phill Park;Dongsoo Lee;Roy, K.;]]></authors>
		</item>
		<item>
			<title><![CDATA[AdNoC: Runtime Adaptive Network-on-Chip Architecture]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5676239]]></link>
			<description><![CDATA[Networsk-on-chip (NoCs) have emerged as a promising on-chip interconnect for future multi/many-core architectures as NoCs are able to scale communication links with the growing number of cores. State-of-the-art NoC designs rely mainly on a static network configuration using fixed routing algorithms and buffer placements. These approaches are not effective in dealing with hard-to-predict system behavior, for instance due to user behavior or varying workloads, since in order for static NoCs to cover these scenarios, they would have to be designed for worst case scenarios. In this paper, we address these problems with a runtime adaptive network-on-chip (AdNoC). Focusing on the architecture-level adaptation, we present an adaptive route allocation algorithm which provides a required level of QoS (guaranteed bandwidth) coupled with an adaptive buffer assignment scheme which reassigns buffer blocks on-demand. Furthermore, the adaptivity requires a comprehensive, hardly intrusive, runtime observability infrastructure, i.e., using monitoring components, in order to gather data on the system state. The area overhead introduced by the adaptive scheme can be traded off against the flexibility gained. Moreover, the area overhead is also reduced by resource multiplexing due to the on-demand buffer assignment at each output port (we achieved on an average 42% buffer saving in our experiments). We demonstrate the advantage by using various digital media applications and compare our approach to the state-of-the-art static NoC architectures e.g., Xpipe, QNoC, and &#x00C6;thereal.]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5676239]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>257</startPage>
			<endPage>269</endPage>
			<fileSize>2848</fileSize>
			<authors><![CDATA[Al Faruque, M.A.;Ebi, T.;Henkel, J.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Design and Implementation of Backtracking Wave-Pipeline Switch to Support Guaranteed Throughput in Network-on-Chip]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5678607]]></link>
			<description><![CDATA[It is a challenging task in a network-on-chip to design an on-chip switch/router to dynamically support (hard) guaranteed throughput under very tight on-chip constraints of power, timing, area, and time-to-market. This paper presents the design and implementation of a novel pipeline circuit-switched switch to support guaranteed throughput. The proposed circuit-switched switch, based on a backtracking probing path setup, operates with a source-synchronous wave-pipeline approach. The switch can support a dead- and live-lock free dynamic path-setup scheme and can achieve high bandwidth and high area and energy efficiency. A silicon-proven prototype of a 16-bit-data 5-bidirectional-port switch in a four-metal-layer 0.18-&#x03BC; m CMOS standard-cell technology can yield an aggregate data bandwidth of up to 73.84 Gb/s, while occupying only a modest area of 0.0315 mm<sup>2</sup>. The synthesizable implementation of the proposed switch also results in a cost-effective design, fast development time, and portability.]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5678607]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>270</startPage>
			<endPage>283</endPage>
			<fileSize>2021</fileSize>
			<authors><![CDATA[Phi-Hung Pham;Jongsun Park;Phuong Mau;Chulwoo Kim;]]></authors>
		</item>
		<item>
			<title><![CDATA[Reconsidering High-Speed Design Criteria for Transmission-Gate-Based Master&#x2013;Slave Flip-Flops]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5686902]]></link>
			<description><![CDATA[In this paper we show that, when dealing with transmission-gate-based master-slave (TGMS) flip-flops (FFs), a reconsideration of the classical approach for the delay minimization is worthwhile to improve the performance in high-speed designs. In particular, by splitting such FFs into two sections that are separately optimized and then reconciling the results, the emerging design always outperforms the one resulting from the employment of a classical Logical Effort procedure assuming such FFs as a whole continuous path. Simulations are performed on several well-known TGMS FFs, designed in a 65-nm technology, to validate the correctness of such a procedure and of the underlying assumptions. Significant improvements are found on delay and, remarkably, on energy and area occupation, thus showing that this approach allows to correctly deal with the actual path effort in such circuits and hence to more properly steer the design towards the achievement of energy efficiency in the high-speed region.]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5686902]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>284</startPage>
			<endPage>295</endPage>
			<fileSize>1167</fileSize>
			<authors><![CDATA[Consoli, E.;Palumbo, G.;Pennisi, M.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Rank Metric Decoder Architectures for Random Linear Network Coding With Error Control]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5682080]]></link>
			<description><![CDATA[While random linear network coding is a powerful tool for disseminating information in communication networks, it is highly susceptible to errors caused by various sources. Due to error propagation, errors greatly deteriorate the throughput of network coding and seriously undermine both reliability and security of data. Hence, error control for network coding is vital. Recently, constant-dimension codes (CDCs), especially Ko&#x0308;tter-Kschischang (KK) codes, have been proposed for error control in random linear network coding. KK codes can also be constructed from Gabidulin codes, an important class of rank metric codes. Rank metric decoders have been recently proposed for both Gabidulin and KK codes, but they have high computational complexities. Furthermore, it is not clear whether such decoders are feasible and suitable for hardware implementations. In this paper, we reduce the complexities of rank metric decoders and propose novel decoder architectures for both codes. The synthesis results of our decoder architectures for Gabidulin and KK codes with limited error-correcting capabilities over small fields show that our architectures not only are affordable, but also achieve high throughput.]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5682080]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>296</startPage>
			<endPage>309</endPage>
			<fileSize>895</fileSize>
			<authors><![CDATA[Ning Chen;Zhiyuan Yan;Gadouleau, M.;Ying Wang;Suter, B.W.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Energy-Aware Video Encoding for Image Quality Improvement in Battery-Operated Surveillance Camera]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5699969]]></link>
			<description><![CDATA[Growing needs for surveillance in locations without power lines necessitates the development of a surveillance camera with extremely low-power consumption and an assured stable operation until the time of expected run-out of available energy. This paper proposes an algorithm for scheduling of video encoding configurations in a battery-operated surveillance system to reduce the image distortion while assuring the sustained operation until the battery recharge/exchange. The optimal video encoding configuration is determined based on the amount of estimated remaining event duration (considering the uncertainty of events) and remaining battery charge (considering the rate-capacity and recovery effect). The proposed algorithm consists of two steps: design-time step and run-time step. In the design-time step, prediction of remaining event duration, called duration prediction, is performed considering the uncertainty of events and tradeoff between encoding power and image quality. During run-time, video encoding configuration is switched between intra-frame encoding and inter-frame encoding based on the duration prediction obtained in design-time step and the remaining battery charge measured in run-time step. Compared to the conventional method based on the most conservative duration prediction , experimental results show that the proposed method provides 2.24~3.78 dB improvement in the image quality (in terms of peak signal-to-noise ratio in the H.264 encoding of four video sequences while satisfying the battery constraint.]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5699969]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>310</startPage>
			<endPage>318</endPage>
			<fileSize>472</fileSize>
			<authors><![CDATA[Younghoon Lee;Jungsoo Kim;Chong-Min Kyung;]]></authors>
		</item>
		<item>
			<title><![CDATA[Ultralow-Voltage Process-Variation-Tolerant Schmitt-Trigger-Based SRAM Design]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5704587]]></link>
			<description><![CDATA[We analyze Schmitt-Trigger (ST)-based differential-sensing static random access memory (SRAM) bitcells for ultralow-voltage operation. The ST-based SRAM bitcells address the fundamental conflicting design requirement of the read versus write operation of a conventional 6T bitcell. The ST operation gives better read-stability as well as better write-ability compared to the standard 6T bitcell. The proposed ST bitcells incorporate a built-in feedback mechanism, achieving process variation tolerance - a must for future nano-scaled technology nodes. A detailed comparison of different bitcells under iso-area condition shows that the ST-2 bitcell can operate at lower supply voltages. Measurement results on ten test-chips fabricated in 130-nm CMOS technology show that the proposed ST-2 bitcell gives 1.6&#x00D7; higher read static noise margin, 2&#x00D7; higher write-trip-point and 120-mV lower read-V<sub>min</sub> compared to the iso-area 6T bitcell.]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5704587]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>319</startPage>
			<endPage>332</endPage>
			<fileSize>3016</fileSize>
			<authors><![CDATA[Kulkarni, J.P.;Roy, K.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Adaptive Performance Compensation With In-Situ Timing Error Predictive Sensors for Subthreshold Circuits]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5702356]]></link>
			<description><![CDATA[We present an adaptive technique for compensating manufacturing and environmental variability in subthreshold circuits using &#x201C;canary flip-flop (FF),&#x201D; which can predict timing errors. A 32-bit Kogge-Stone adder whose performance was controlled by body-biasing was fabricated in a 65-nm CMOS process. Measurement results show that the adaptive control can compensate process, supply voltage, and temperature variations and improve the energy efficiency of subthreshold circuits by up to 46% compared to worst-case design and operation with guardbanding. We also discuss how to determine design parameters, such as the inserted location and the buffer delay of the canary FF, supposing two approaches: configuration in the design phase and post-silicon tuning.]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5702356]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>333</startPage>
			<endPage>343</endPage>
			<fileSize>842</fileSize>
			<authors><![CDATA[Fuketa, H.;Hashimoto, M.;Mitsuyama, Y.;Onoye, T.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Experimental Characterization and Analysis of an Asynchronous Approach for Reduction of Substrate Noise in Digital Circuitry]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5702262]]></link>
			<description><![CDATA[Delay insensitive asynchronous circuitry provides significant advantages with respect to substrate noise due to localized switching. The differences between the substrate noise from NULL convention logic (NCL) and traditional clocked Boolean logic (CBL) are described and analyzed based on measured results. A test chip fabricated in the TSMC 0.25 &#x03BC;m process shows that a pseudo-random number generator implemented with NCL generates 23 dB less substrate noise compared to the equivalent synchronous design. In a larger scale digital circuit, the substrate noise improvement offered by an asynchronous 8051 processor over its synchronous counterpart was nearly 10 dB. The effect of this substrate noise on an analog circuit was explored with a delta-sigma modulator (DSM) example. The signal-to-noise ratio performance of a second order DSM was not affected by the substrate noise from the NCL 8051 processor while it experiences up to 15 dB degradation when the CBL 8051 processor is clocked near integer multiples of the DSM sampling frequency.]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5702262]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>344</startPage>
			<endPage>356</endPage>
			<fileSize>1842</fileSize>
			<authors><![CDATA[Le, J.;Hanken, C.;Held, M.;Hagedorn, M.S.;Mayaram, K.;Fiez, T.S.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Accumulator Based 3-Weight Pattern Generation]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5710025]]></link>
			<description><![CDATA[Weighted pseudorandom built-in self test (BIST) schemes have been utilized in order to drive down the number of vectors to achieve complete fault coverage in BIST applications. Weighted sets comprising three weights, namely 0, 1, and 0.5 have been successfully utilized so far for test pattern generation, since they result in both low testing time and low consumed power. In this paper an accumulator-based 3-weight test pattern generation scheme is presented; the proposed scheme generates set of patterns with weights 0, 0.5, and 1. Since accumulators are commonly found in current VLSI chips, this scheme can be efficiently utilized to drive down the hardware of BIST pattern generation, as well. Comparisons with previously presented schemes indicate that the proposed scheme compares favorably with respect to the required hardware.]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5710025]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>357</startPage>
			<endPage>361</endPage>
			<fileSize>436</fileSize>
			<authors><![CDATA[Paschalis, A.;Voyiatzis, I.;Gizopoulos, D.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Low-Power Pulse-Triggered Flip-Flop Design With Conditional Pulse-Enhancement Scheme]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5682078]]></link>
			<description><![CDATA[In this paper, a novel low-power pulse-triggered flip-flop (FF) design is presented. First, the pulse generation control logic, an and function, is removed from the critical path to facilitate a faster discharge operation. A simple two-transistor and gate design is used to reduce the circuit complexity. Second, a conditional pulse-enhancement technique is devised to speed up the discharge along the critical path only when needed. As a result, transistor sizes in delay inverter and pulse-generation circuit can be reduced for power saving. Various postlayout simulation results based on UMC CMOS 90-nm technology reveal that the proposed design features the best power-delay-product performance in seven FF designs under comparison. Its maximum power saving against rival designs is up to 38.4%. Compared with the conventional transmission gate-based FF design, the average leakage power consumption is also reduced by a factor of 3.52.]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5682078]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>361</startPage>
			<endPage>366</endPage>
			<fileSize>892</fileSize>
			<authors><![CDATA[Yin-Tsung Hwang;Jin-Fa Lin;Ming-Hwa Sheu;]]></authors>
		</item>
		<item>
			<title><![CDATA[Area-Efficient Parallel FIR Digital Filter Structures for Symmetric Convolutions Based on Fast FIR Algorithm]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5676240]]></link>
			<description><![CDATA[Based on fast finite-impulse response (FIR) algorithms (FFAs), this paper proposes new parallel FIR filter structures, which are beneficial to symmetric coefficients in terms of the hardware cost, under the condition that the number of taps is a multiple of 2 or 3. The proposed parallel FIR structures exploit the inherent nature of symmetric coefficients reducing half the number of multipliers in subfilter section at the expense of additional adders in preprocessing and postprocessing blocks. Exchanging multipliers with adders is advantageous because adders weigh less than multipliers in terms of silicon area; in addition, the overhead from the additional adders in preprocessing and postprocessing blocks stay fixed and do not increase along with the length of the FIR filter, whereas the number of reduced multipliers increases along with the length of the FIR filter. For example, for a four-parallel 72-tap filter, the proposed structure saves 27 multipliers at the expense of 11 adders, whereas for a four-parallel 576-tap filter, the proposed structure saves 216 multipliers at the expense of 11 adders still. Overall, the proposed parallel FIR structures can lead to significant hardware savings for symmetric convolutions from the existing FFA parallel FIR filter, especially when the length of the filter is large.]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5676240]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>366</startPage>
			<endPage>371</endPage>
			<fileSize>337</fileSize>
			<authors><![CDATA[Yu-Chi Tsao;Ken Choi;]]></authors>
		</item>
		<item>
			<title><![CDATA[Low-Power and Area-Efficient Carry Select Adder]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5701677]]></link>
			<description><![CDATA[Carry Select Adder (CSLA) is one of the fastest adders used in many data-processing processors to perform fast arithmetic functions. From the structure of the CSLA, it is clear that there is scope for reducing the area and power consumption in the CSLA. This work uses a simple and efficient gate-level modification to significantly reduce the area and power of the CSLA. Based on this modification 8-, 16-, 32-, and 64-b square-root CSLA (SQRT CSLA) architecture have been developed and compared with the regular SQRT CSLA architecture. The proposed design has reduced area and power as compared with the regular SQRT CSLA with only a slight increase in the delay. This work evaluates the performance of the proposed designs in terms of delay, area, power, and their products by hand with logical effort and through custom design and layout in 0.18-&#x03BC;m CMOS process technology. The results analysis shows that the proposed CSLA structure is better than the regular SQRT CSLA.]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5701677]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>371</startPage>
			<endPage>375</endPage>
			<fileSize>291</fileSize>
			<authors><![CDATA[Ramkumar, B.;Kittur, H.M.;]]></authors>
		</item>
		<item>
			<title><![CDATA[A Low-Power Single-Phase Clock Multiband Flexible Divider]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5686904]]></link>
			<description><![CDATA[In this paper, a low-power single-phase clock multiband flexible divider for Bluetooth, Zigbee, and IEEE 802.15.4 and 802.11 a/b/g WLAN frequency synthesizers is proposed based on pulse-swallow topology and is implemented using a 0.18-&#x03BC;m CMOS technology. The multiband divider consists of a proposed wideband multimodulus 32/33/47/48 prescaler and an improved bit-cell for swallow (S) counter and can divide the frequencies in the three bands of 2.4-2.484 GHz, 5.15-5.35 GHz, and 5.725-5.825 GHz with a resolution selectable from 1 to 25 MHz. The proposed multiband flexible divider is silicon verified and consumes power of 0.96 and 2.2 mW in 2.4- and 5-GHz bands, respectively, when operated at 1.8-V power supply.]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5686904]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>376</startPage>
			<endPage>380</endPage>
			<fileSize>322</fileSize>
			<authors><![CDATA[Manthena, V.K.;Manh Anh Do;Chirn Chye Boon;Kiat Seng Yeo;]]></authors>
		</item>
		<item>
			<title><![CDATA[Design of a Tri-Modal Multi-Threshold CMOS Switch With Application to Data Retentive Power Gating]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5705529]]></link>
			<description><![CDATA[A tri-modal multi-threshold CMOS (MTCMOS) switch design is presented. Similar to the conventional MTCMOS switches, the tri-modal switch comes in two flavors: header and footer. The tri-modal switch provides three different power modes for the underlying circuit: active, drowsy, and sleep. The ability of data retention in the drowsy mode makes the proposed tri-modal switch an excellent candidate for implementing data-retentive power gating designs. We will see that three different low-power design schemes, namely data-retentive power gating, multi-drowsy mode structures, and on-chip dynamic voltage scaling, are implemented using the proposed tri-modal switch. We show that our proposal introduces superior low-power solutions across various circuit operating modes using a single circuitry.]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5705529]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>380</startPage>
			<endPage>385</endPage>
			<fileSize>292</fileSize>
			<authors><![CDATA[Pakbaznia, E.;Pedram, M.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Period Extension and Randomness Enhancement Using High-Throughput Reseeding-Mixing PRNG]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5711011]]></link>
			<description><![CDATA[We present a new reseeding-mixing method to extend the system period length and to enhance the statistical properties of a chaos-based logistic map pseudo random number generator (PRNG). The reseeding method removes the short periods of the digitized logistic map and the mixing method extends the system period length to 2<sup>253</sup> by &#x201C;xoring&#x201D; with a DX generator. When implemented in the TSMC 0.18- &#x03BC;m 1P6M CMOS process, the new reseeding-mixing PRNG (RM-PRNG) attains the best throughput rate of 6.4 Gb/s compared with other nonlinear PRNGs. In addition, the generated random sequences pass the NIST SP 800-22 statistical tests including ratio test and U-value test.]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=5711011]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>385</startPage>
			<endPage>389</endPage>
			<fileSize>449</fileSize>
			<authors><![CDATA[Chung-Yi Li;Yuan-Ho Chen;Tsin-Yuan Chang;Lih-Yuan Deng;Kiwing To;]]></authors>
		</item>
		<item>
			<title><![CDATA[IEEE Transactions on Very Large Scale Integration (VLSI) Systems information for authors]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=6129941]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=6129941]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>390</startPage>
			<endPage>390</endPage>
			<fileSize>93</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[IEEE Copyright Form]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=6129942]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=6129942]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>391</startPage>
			<endPage>392</endPage>
			<fileSize>1564</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[IEEE Transactions on Very Large Scale Integration (VLSI) Systems society information]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=6129944]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[Feb.  2012]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=6129939&arnumber=6129944]]></guid>
			<volume>20</volume>
			<issue>2</issue>
			<startPage>C3</startPage>
			<endPage>C3</endPage>
			<fileSize>27</fileSize>
			<authors><![CDATA[]]></authors>
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