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		<title><![CDATA[ Electrical Insulation Magazine, IEEE - new TOC ]]></title>
		<link>http://ieeexplore.ieee.org</link>
		<description>TOC Alert for Publication# 57 </description>
		<year>2013</year>
		<month>May      </month>
		<day>16</day>
		<item>
			<title><![CDATA[Table of contents]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507405]]></link>
			<description><![CDATA[Presents the table of contents for this issue of this magazine.]]></description>
			<pubDate><![CDATA[May-June  2013]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507405]]></guid>
			<volume>29</volume>
			<issue>3</issue>
			<startPage>1</startPage>
			<endPage>2</endPage>
			<fileSize>80</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[IEEE Transactions on Dielectrics and Electrical Insulation - [Executive Committee]]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507406]]></link>
			<description><![CDATA[Provides a listing of current society officers.]]></description>
			<pubDate><![CDATA[May-June  2013]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507406]]></guid>
			<volume>29</volume>
			<issue>3</issue>
			<startPage>3</startPage>
			<endPage>3</endPage>
			<fileSize>94</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[Editorial]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507407]]></link>
			<description><![CDATA[Ed Cherney and I were appointed Co- Editors-in-Chief of this Magazine with effect 1 January 2008. In mid-January we met with the outgoing Editor-in-Chief John Densley, at his home outside Toronto, and were instructed on many important aspects of the job, at the nuts-and-bolts level. I co-edited the May/June issue with John, Ed did likewise for the July/August issue, and thereafter we went solo, editing alternate issues. The appointment of two Co-Editors-in-Chief, rather than one Editor-in-Chief, was one of the concerns raised during the 2012 IEEE Periodicals Review and Advisory Committee (PRAC) five-yearly review of the Magazine, specifically that such an arrangement would lead to substantial duplication of editorial effort. We convinced the committee that this is not the case and that the arrangement offers the advantage of helping to ensure continuity of publication should one of the Co-Editors become incapacitated.]]></description>
			<pubDate><![CDATA[May-June  2013]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507407]]></guid>
			<volume>29</volume>
			<issue>3</issue>
			<startPage>4</startPage>
			<endPage>5</endPage>
			<fileSize>871</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[From the editors' desk]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507408]]></link>
			<description><![CDATA[The first article in this issue is ??Partial Discharge Diagnostics: From Apparatus Monitoring to Smart Grid Assessment?? by Giancarlo Montanari and Andrea Cavallini, University of Bologna, Italy. It is the third in a series of reviews to be published in the Magazine to mark the 50th anniversary of DEIS. In it common knowledge of partial discharge mechanisms and measurements is reviewed, in order to explain why application of this powerful diagnostic technology has not been as widespread as might be expected. Condition-based maintenance of electrical apparatus based on PD detection has been moving toward on-line measurements for at least the last 20 years. So why is there still considerable activity in off-line PD testing today, probably even more than in on-line testing? The answer is straightforward: offline measurements offer the possibility of reduced noise, whereas on-line measurements may be severely affected by noise and disturbance from electrical apparatus other than that under test. Noise and disturbance rejection is essential for greater acceptability of on-line PD detection. The authors discuss some of the methods which have been proposed recently for noise rejection, based on time-of-flight techniques or on decomposition of the acquired PD pulse waveforms. Identification of the type of defect responsible for a given PD pattern is another important task, at present usually carried out by ??experts.?? However, this approach is incompatible with on-line, conditionbased- maintenance practices, because of the very large data stream generated by on-line monitoring, and the likely scarcity of experts. Thus efforts are being made to develop artificial intelligence tools, such as fuzzy logic or neural networks.]]></description>
			<pubDate><![CDATA[May-June  2013]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507408]]></guid>
			<volume>29</volume>
			<issue>3</issue>
			<startPage>6</startPage>
			<endPage>7</endPage>
			<fileSize>131</fileSize>
			<authors><![CDATA[Cherney, E.;Fleming, R.;Gleichman, G.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Partial discharge diagnostics: from apparatus monitoring to smart grid assessment]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507409]]></link>
			<description><![CDATA[Partial discharges (PD) are very familiar in the electrical insulation world. A phenomenon able to reveal or cause incipient failure, as well as need of maintenance, of an electrical apparatus must play a fundamental role in the development of electrical asset diagnosis and design.]]></description>
			<pubDate><![CDATA[May-June  2013]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507409]]></guid>
			<volume>29</volume>
			<issue>3</issue>
			<startPage>8</startPage>
			<endPage>17</endPage>
			<fileSize>2768</fileSize>
			<authors><![CDATA[Montanari, G.C.;Cavallini, A.;]]></authors>
		</item>
		<item>
			<title><![CDATA[50 years in the development of polymer suspension-type insulators]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507410]]></link>
			<description><![CDATA[The article reviews 50 years in the development of polymer suspension-type insulators for overhead lines and outlines the remaining issues that limit their greater use.]]></description>
			<pubDate><![CDATA[May-June  2013]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507410]]></guid>
			<volume>29</volume>
			<issue>3</issue>
			<startPage>18</startPage>
			<endPage>26</endPage>
			<fileSize>1740</fileSize>
			<authors><![CDATA[Cherney, E.A.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Insulation of electrical cables over the past 50 years]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507411]]></link>
			<description><![CDATA[Major developments in the insulation of power cables over the last 50 years are reviewed. Following the introduction of new materials such as nanocomposites, the next 50 years promise to be equally challenging.]]></description>
			<pubDate><![CDATA[May-June  2013]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507411]]></guid>
			<volume>29</volume>
			<issue>3</issue>
			<startPage>27</startPage>
			<endPage>32</endPage>
			<fileSize>1196</fileSize>
			<authors><![CDATA[Barber, K.;Alexander, G.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Frequency response analysis and short-circuit impedance measurement in detection of winding deformation within power transformers]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507412]]></link>
			<description><![CDATA[Power transformers are in service under different environmental, electrical, and mechanical conditions [1] and may be subject to enormous hazards during the course of operation [2], [3]. They are commonly considered to be the heart of the transmission and distribution sectors of electric power systems; monitoring their condition and diagnosing faults are important parts of the maintenance function [4]. Utility engineers strive to keep power transformers in service and to prevent even shortterm outages. Failure of a transformer can cause extensive damage to equipment owned by consumers or the utility [5].]]></description>
			<pubDate><![CDATA[May-June  2013]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507412]]></guid>
			<volume>29</volume>
			<issue>3</issue>
			<startPage>33</startPage>
			<endPage>40</endPage>
			<fileSize>1492</fileSize>
			<authors><![CDATA[Bagheri, M.;Naderi, M.S.;Blackburn, T.;Phung, T.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Partial discharge diagnostics for mixed-technology switchgear (MTS) in outdoor substations]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507413]]></link>
			<description><![CDATA[It has been more than 10 years since the first use of mixedtechnology switchgear (MTS) in HV substations. Mixed-technology switchgear (also known as hybrid switchgear) is now used worldwide and offers another substation technology option alongside gas-insulated switchgear (GIS) and air-insulated switchgear equipment. The terms ??mixed technology?? and ??hybrid?? refer to a combination of traditional air-insulated switchgear and newer SF<sub>6</sub> metal-clad GIS. Mixed-technology switchgear technology provides metal-enclosed switchgear modules similar to those used in GIS substations but connected by conventional outdoor air-insulated busbars. The MTS module is a self-contained switching module suitable for use in outdoor substations and uses proven GIS components.]]></description>
			<pubDate><![CDATA[May-June  2013]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507413]]></guid>
			<volume>29</volume>
			<issue>3</issue>
			<startPage>41</startPage>
			<endPage>47</endPage>
			<fileSize>2070</fileSize>
			<authors><![CDATA[Lopez-Roldan, J.;Blundell, M.;Irwin, T.;Charlson, C.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Understanding power transformer frequency response analysis signatures]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507414]]></link>
			<description><![CDATA[This paper presents a comprehensive analysis of the effects of various faults on the FRA signatures of a transformer simulated by a high-frequency model. The faults were simulated through changes in the values of some of the electrical components in the model. It was found that radial displacement of a winding alters the FRA signature over the entire frequency range (10 Hz-1 MHz), whereas changes due to axial displacement occur only at frequencies above 200 kHz. A Table listing various transformer faults and the associated changes in the FRA signature was compiled and could be used in the formulation of standard codes for power transformer FRA signature interpretation.]]></description>
			<pubDate><![CDATA[May-June  2013]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507414]]></guid>
			<volume>29</volume>
			<issue>3</issue>
			<startPage>48</startPage>
			<endPage>56</endPage>
			<fileSize>3399</fileSize>
			<authors><![CDATA[Abu-Siada, A.;Hashemnia, N.;Islam, S.;Masoum, M.A.S.;]]></authors>
		</item>
		<item>
			<title><![CDATA[2012 international conference on high voltage engineering and application]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507415]]></link>
			<description><![CDATA[Chongqing University, Shanghai Jiao Tong University, and Mississippi State University jointly organized the 2012 International Conference on High Voltage Engineering and Application (ICHVE 2012) in Shanghai, China, September 17?? 20, 2012.]]></description>
			<pubDate><![CDATA[May-June  2013]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507415]]></guid>
			<volume>29</volume>
			<issue>3</issue>
			<startPage>57</startPage>
			<endPage>60</endPage>
			<fileSize>2888</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[DEIS news]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507416]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[May-June  2013]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507416]]></guid>
			<volume>29</volume>
			<issue>3</issue>
			<startPage>61</startPage>
			<endPage>61</endPage>
			<fileSize>199</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[News from Japan]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507417]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[May-June  2013]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507417]]></guid>
			<volume>29</volume>
			<issue>3</issue>
			<startPage>62</startPage>
			<endPage>63</endPage>
			<fileSize>859</fileSize>
			<authors><![CDATA[Ohki, Y.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Book reviews [7 books reviewed]]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507418]]></link>
			<description><![CDATA[The following books are reviews: "Plasma Processing of Nanomaterials" (Sankaran, R.M., Ed; 2012); "Power Vacuum Tubes Handbook, 3rd Edition" (Whitaker, J.C.; 2012); "RFID-Enabled Sensor Design and Applications" (Rida, A., et al; 2010); "An Introduction to Electronic Materials for Engineers, 2nd Edition" (Gao, W., et al; 2011); "Electrical Power Transmission and Distribution" (Chudnovsky, B.H.; 2013); and "Small Antenna Handbook" (Hansen, R.C. and Collin, R.E.; 2011) "Principles of Uncertainty: (J. B. Kadane, J.B.; 2011).]]></description>
			<pubDate><![CDATA[May-June  2013]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507418]]></guid>
			<volume>29</volume>
			<issue>3</issue>
			<startPage>64</startPage>
			<endPage>67</endPage>
			<fileSize>184</fileSize>
			<authors><![CDATA[Shea, J.J.;]]></authors>
		</item>
		<item>
			<title><![CDATA[IEEE media advertising sales offices]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507419]]></link>
			<description><![CDATA[Provides a listing of current media advertising staff.]]></description>
			<pubDate><![CDATA[May-June  2013]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507419]]></guid>
			<volume>29</volume>
			<issue>3</issue>
			<startPage>68</startPage>
			<endPage>68</endPage>
			<fileSize>219</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[Meetings calendar]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507420]]></link>
			<description><![CDATA[Provides a notice of upcoming conference events of interest to practitioners and researchers.]]></description>
			<pubDate><![CDATA[May-June  2013]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507420]]></guid>
			<volume>29</volume>
			<issue>3</issue>
			<startPage>69</startPage>
			<endPage>70</endPage>
			<fileSize>144</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[IEEE Electrical Insulation Magazine [Front cover]]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507423]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[May-June  2013]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507423]]></guid>
			<volume>29</volume>
			<issue>3</issue>
			<startPage>c1</startPage>
			<endPage>c1</endPage>
			<fileSize>748</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[Author's guide]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507425]]></link>
			<description><![CDATA[Provides instructions and guidelines to prospective authors who wish to submit manuscripts.]]></description>
			<pubDate><![CDATA[May-June  2013]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6507425]]></guid>
			<volume>29</volume>
			<issue>3</issue>
			<startPage>c3</startPage>
			<endPage>c3</endPage>
			<fileSize>42</fileSize>
			<authors><![CDATA[]]></authors>
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