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		<title><![CDATA[ Potentials, IEEE - new TOC ]]></title>
		<link>http://ieeexplore.ieee.org</link>
		<description>TOC Alert for Publication# 45 </description>
		<year>2008</year>
		<month>July     </month>
		<day>30</day>
		<item>
			<title><![CDATA[IEEE Potenials]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517486]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[May-June  2008]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517486]]></guid>
			<volume>27</volume>
			<issue>3</issue>
			<startPage>C1</startPage>
			<endPage>C1</endPage>
			<fileSize>1446</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[Table of Contents]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517488]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[May-June  2008]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517488]]></guid>
			<volume>27</volume>
			<issue>3</issue>
			<startPage>1</startPage>
			<endPage>1</endPage>
			<fileSize>134</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[Staff]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517489]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[May-June  2008]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517489]]></guid>
			<volume>27</volume>
			<issue>3</issue>
			<startPage>2</startPage>
			<endPage>2</endPage>
			<fileSize>50</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[Editorial]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517490]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[May-June  2008]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517490]]></guid>
			<volume>27</volume>
			<issue>3</issue>
			<startPage>3</startPage>
			<endPage>3</endPage>
			<fileSize>35</fileSize>
			<authors><![CDATA[Johnston, E.T.B.;]]></authors>
		</item>
		<item>
			<title><![CDATA[The way ahead]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517491]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[May-June  2008]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517491]]></guid>
			<volume>27</volume>
			<issue>3</issue>
			<startPage>3</startPage>
			<endPage>4</endPage>
			<fileSize>583</fileSize>
			<authors><![CDATA[Beheshti, B.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Letter to the editor]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517492]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[May-June  2008]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517492]]></guid>
			<volume>27</volume>
			<issue>3</issue>
			<startPage>5</startPage>
			<endPage>5</endPage>
			<fileSize>201</fileSize>
			<authors><![CDATA[Hong-Lok Li;]]></authors>
		</item>
		<item>
			<title><![CDATA[Going green: The IEEE-USA Salary and Fringe Benefits Survey]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517493]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[May-June  2008]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517493]]></guid>
			<volume>27</volume>
			<issue>3</issue>
			<startPage>6</startPage>
			<endPage>10</endPage>
			<fileSize>2507</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[Being aggressive in the shadow of a recession]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517494]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[May-June  2008]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517494]]></guid>
			<volume>27</volume>
			<issue>3</issue>
			<startPage>11</startPage>
			<endPage>12</endPage>
			<fileSize>750</fileSize>
			<authors><![CDATA[Causer, C.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Become a master troubleshooter]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517495]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[May-June  2008]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517495]]></guid>
			<volume>27</volume>
			<issue>3</issue>
			<startPage>13</startPage>
			<endPage>14</endPage>
			<fileSize>869</fileSize>
			<authors><![CDATA[Johnson, P.;]]></authors>
		</item>
		<item>
			<title><![CDATA[So, you want to be a manager¿]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517496]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[May-June  2008]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517496]]></guid>
			<volume>27</volume>
			<issue>3</issue>
			<startPage>15</startPage>
			<endPage>16</endPage>
			<fileSize>267</fileSize>
			<authors><![CDATA[Tracy, K.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Googly eyes: Students sluggish with ICT literacy]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517497]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[May-June  2008]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517497]]></guid>
			<volume>27</volume>
			<issue>3</issue>
			<startPage>17</startPage>
			<endPage>18</endPage>
			<fileSize>664</fileSize>
			<authors><![CDATA[Causer, C.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Eyeing a real-time human-computer interface to assist those with motor disabilities]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517498]]></link>
			<description><![CDATA[The objective of this study was to design an adaptive, real-time assistive system as an alternate HCI that will give computer access to individuals with severe motor disabilities by means of eye gazing only. It focused on the implementation of an algorithm to smooth out abrupt and unwanted jerky behavior of the mouse cursor due to the saccadic nature of the eye movement via the configuration of an artificial neural network that minimizes the jitter effect based on user characteristics. These characteristics were extracted via the creation of user profiles through an embedded graphical interface.]]></description>
			<pubDate><![CDATA[May-June  2008]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517498]]></guid>
			<volume>27</volume>
			<issue>3</issue>
			<startPage>19</startPage>
			<endPage>25</endPage>
			<fileSize>2543</fileSize>
			<authors><![CDATA[Sesin, A.;Adjouadi, M.;Ayala, M.;Cabrerizo, M.;Barreto, A.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Thin film transistors guide the way to active-matrix revolutions]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517499]]></link>
			<description><![CDATA[TFTs are a crucial component in modern active-matrix displays, enabling the high-quality images and fast response times that many users now take for granted. Amorphous and poly Si TFTs have undergone much development in the last couple of decades, with many breakthroughs in performance and reliability. The emergence of exciting new technologies that may enable flexible displays in the future will ensure that the TFT remains a hot topic of research for many years to come, regardless of the material from which it is made.]]></description>
			<pubDate><![CDATA[May-June  2008]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517499]]></guid>
			<volume>27</volume>
			<issue>3</issue>
			<startPage>26</startPage>
			<endPage>30</endPage>
			<fileSize>1586</fileSize>
			<authors><![CDATA[Nicholas, G.;Shah, S.;]]></authors>
		</item>
		<item>
			<title><![CDATA[CMOS imaging for biomedical applications]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517500]]></link>
			<description><![CDATA[CMOS photodetectors and imaging systems have shown that they possess adequate performance characteristics to replace CCDs or PMTs in some biomedical applications, thereby providing low power, portable, and cheap integrated bioimaging systems. Some advanced solutions, like novel active pixel sensors that detect ultra-low light levels, and avalanche photodiodes that are integrated in CMOS and perform single photon detection, are addressed in this paper.]]></description>
			<pubDate><![CDATA[May-June  2008]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517500]]></guid>
			<volume>27</volume>
			<issue>3</issue>
			<startPage>31</startPage>
			<endPage>36</endPage>
			<fileSize>2384</fileSize>
			<authors><![CDATA[Faramarzpour, N.;El-Desouki, M.;Deen, M.J.;Qiyin Fang;Shirani, S.;Liu, L.W.C.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Powerformers: A breakthrough of high-voltage power generators]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517501]]></link>
			<description><![CDATA[This article deals with the powerformer, a new generator that can be directly connected to the transmission network without the need for a step-up transformer. Due to the powerformer's ability to generate electricity at transmission voltage levels, it offers considerable gains with respect to reactive power production and plant efficiency. Hence, a powerformer both facilitates network stability and decreases the exploitation of natural resources. The upper limit for the output voltage from the powerformer is set by state-of-the-art XLPE power-cable technology. Therefore, powerformers revolutionize the age of old power generation technology and signal a quantum leap in electrical engineering.]]></description>
			<pubDate><![CDATA[May-June  2008]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517501]]></guid>
			<volume>27</volume>
			<issue>3</issue>
			<startPage>37</startPage>
			<endPage>44</endPage>
			<fileSize>1835</fileSize>
			<authors><![CDATA[Metwally, I.A.;Radwan, R.M.;Abou-Elyazied, A.M.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Gamesman solutions]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517502]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[May-June  2008]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517502]]></guid>
			<volume>27</volume>
			<issue>3</issue>
			<startPage>44</startPage>
			<endPage>44</endPage>
			<fileSize>102</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[IEEE Media Advertising Sales Offices]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517503]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[May-June  2008]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517503]]></guid>
			<volume>27</volume>
			<issue>3</issue>
			<startPage>45</startPage>
			<endPage>45</endPage>
			<fileSize>102</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[2008 Student Activities Committee e-mail addresses]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517504]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[May-June  2008]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517504]]></guid>
			<volume>27</volume>
			<issue>3</issue>
			<startPage>46</startPage>
			<endPage>46</endPage>
			<fileSize>364</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[You can be the next student editor of IEEE Potentials!]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517505]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[May-June  2008]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517505]]></guid>
			<volume>27</volume>
			<issue>3</issue>
			<startPage>47</startPage>
			<endPage>47</endPage>
			<fileSize>37</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[Gamesman problems]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517507]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[May-June  2008]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4514673&arnumber=4517507]]></guid>
			<volume>27</volume>
			<issue>3</issue>
			<startPage>48</startPage>
			<endPage>48</endPage>
			<fileSize>350</fileSize>
			<authors><![CDATA[]]></authors>
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