<?xml version="1.0" ?>
<rss version="2.0">
	<channel>
		<title><![CDATA[ Reliability, IEEE Transactions on - new TOC ]]></title>
		<link>http://null</link>
		<description>TOC Alert for Publication# 24 </description>
		<year>2013</year>
		<month>May      </month>
		<day>20</day>
		<item>
			<title><![CDATA[Table of contents]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6471871]]></link>
			<description><![CDATA[Presents the cover/table of contents for this issue of the periodical.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6471871]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>C1</startPage>
			<endPage>1</endPage>
			<fileSize>131</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[IEEE Transactions on Reliability publication information]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6471791]]></link>
			<description><![CDATA[Provides a listing of current staff, committee members and society officers.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6471791]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>C2</startPage>
			<endPage>C2</endPage>
			<fileSize>132</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[A Meta-Analysis of Multisample Type-II Censored Data With Parametric and Nonparametric Results]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6425543]]></link>
			<description><![CDATA[We discuss meta-analysis of multiple <i>s</i>-independent Type-II right censored data. In particular, we consider parametric inference using Best Linear Unbiased Estimation, as well as non-parametric inference. We provide pertinent numerical results and two examples to illustrate all the methods of inference developed here.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6425543]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>2</startPage>
			<endPage>12</endPage>
			<fileSize>2333</fileSize>
			<authors><![CDATA[Balakrishnan, N.;Volterman, W.;Li Zhang;]]></authors>
		</item>
		<item>
			<title><![CDATA[A Fast and Accurate Fault Tree Analysis Based on Stochastic Logic Implemented on Field-Programmable Gate Arrays]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6327631]]></link>
			<description><![CDATA[This paper presents a method based on stochastic logic to analyse fault trees. This method supports both static and dynamic gates, and can be applied to any type of fault trees. In this paper, static and dynamic gates would be translated into stochastic logic templates, and a hardware implementation for each gate would be achieved. Based on these hardware templates, it is possible to implement the whole logic on a Field-Programmable Gate Array (FPGA). Utilizing the stochastic logic for implementing a given fault tree on FPGA, the analysis would outperform the following parameters compared to traditional methods: 1) Speed-up, 2) Simplicity, 3) Reliability, and 4) Accuracy. Experimental results illustrate that using stochastic logic for modeling fault trees results in fast convergence of Monte Carlo simulation. Moreover, on average, our FPGA approach takes 50% of the time required by previous emulation approaches. Simplicity is an additional advantage of the proposed approach, achieved because of simplicity behind stochastic logic. Also, the stochastic logic is more reliable compared to traditional logic because any faults like SEUs in stochastic logic have less impact on the whole results compared to traditional arithmetic logic. To evaluate the proposed technique, the analysis is performed on several standard benchmarks composed of static and dynamic gates. The results obtained using this approach agree with those obtained from an analytical approach, which proves that the method is an accurate tool for system reliability modeling.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6327631]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>13</startPage>
			<endPage>22</endPage>
			<fileSize>936</fileSize>
			<authors><![CDATA[Aliee, H.;Zarandi, H.R.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Fuzzy Failure Mode and Effects Analysis Using Fuzzy Evidential Reasoning and Belief Rule-Based Methodology]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423858]]></link>
			<description><![CDATA[The main objective of this paper is to propose a new risk priority model for prioritizing failures in failure mode and effects analysis (FMEA) on the basis of fuzzy evidential reasoning (FER) and belief rule-based (BRB) methodology. The technique is particularly intended to resolve some of the shortcomings in fuzzy FMEA (i.e., fuzzy rule-based) approaches. In the proposed approach, risk factors like occurrence (O), severity (S), and detection (D), along with their relative importance weights, are described using fuzzy belief structures. The FER approach is used to capture and aggregate the diversified, uncertain assessment information given by the FMEA team members; the BRB methodology is used to model the uncertainty, and nonlinear relationships between risk factors and corresponding risk level; and the inference of the rule-based system is implemented using the weighted average-maximum composition algorithm. The Dempster rule of combination is then used to aggregate all relevant rules for assessing and prioritizing the failure modes that have been identified in FMEA. A case study concerning an ocean going fishing vessel in a marine industry is provided and conducted using the proposed model to illustrate its potential applications and benefits.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423858]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>23</startPage>
			<endPage>36</endPage>
			<fileSize>1497</fileSize>
			<authors><![CDATA[Hu-Chen Liu;Long Liu;Qing-Lian Lin;]]></authors>
		</item>
		<item>
			<title><![CDATA[Component Ranking by Birnbaum Importance in Presence of Epistemic Uncertainty in Failure Event Probabilities]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6425542]]></link>
			<description><![CDATA[Birnbaum Importance Measure (IM) allows ranking the components of a system with respect to the impact that their failures have on the system's performance, e.g., its reliability or availability. Such ranking is done in industry to efficiently manage Operation and Maintenance (O&amp;M) activities, and to optimize plant design. In the computation of the Birnbaum IM of the components, uncertainty in the parameters of the system model is often neglected. This neglect may lead to erroneous, possibly non-conservative ranking. In this work, we develop a method based on Possibility Theory (PT) for giving due account to epistemic uncertainties in Birnbaum IMs. An example is given with reference to the components of the Auxiliary FeedWater System (AFWS) of a Nuclear Power Plant.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6425542]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>37</startPage>
			<endPage>48</endPage>
			<fileSize>2298</fileSize>
			<authors><![CDATA[Baraldi, P.;Compare, M.;Zio, E.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Extended Component Importance Measures Considering Aleatory and Epistemic Uncertainties]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423247]]></link>
			<description><![CDATA[We introduce extended component importance measures (Birnbaum importance, RAW, RRW, and Criticality importance) considering aleatory and epistemic uncertainties. The Dempster-Shafer theory, which is considered to be a less restricted extension of probability theory, is proposed as a framework for taking into account both aleatory and epistemic uncertainties. The epistemic uncertainty defined in this paper is the total lack of knowledge of the component state. The objective is to translate this epistemic uncertainty to the epistemic uncertainty of system state, and to the epistemic uncertainty of importance measures of components. Affine arithmetic allows us to provide much tighter bounds in the computing process of interval bounds of importance measures, avoiding the error explosion problem. The efficiency of the proposed measures is demonstrated using a bridge system with different types of reliability data (aleatory uncertainty, epistemic uncertainty, and experts' judgments). The influence of the epistemic uncertainty on the components' rankings is described. Finally, a case study of a fire-detector system located in a production room is provided. A comparison between the proposed measures and the probabilistic importance measures using two-stage Monte Carlo simulations is also made.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423247]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>49</startPage>
			<endPage>65</endPage>
			<fileSize>3124</fileSize>
			<authors><![CDATA[Sallak, M.;Schon, W.;Aguirre, F.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Optimal Maintenance Policy for a Compound Poisson Shock Model]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6449336]]></link>
			<description><![CDATA[Adverse environmental conditions cause infrastructure systems to deteriorate (e.g., loss capacity) over time. Modeling system deterioration is essential to define optimum design strategies, and inspection and maintenance (intervention) programs. In particular, the main purpose of maintenance is to increase the system availability by extending the life of the system. Most strategies for maintenance optimization focus on defining long term strategies based on the system's condition at the decision time (e.g., <i>t</i>=0). However, due to the large uncertainty in the system's performance through life, an optimal maintenance policy requires both permanent monitoring and a cost-efficient plan of interventions. This paper presents a model to define an optimal maintenance policy of systems that deteriorate as a result of shocks. Deterioration caused by shocks is modeled as a compound Poisson process, and the optimal maintenance strategy is based on an impulse control model. In the model, the optimal time and size of interventions are executed according to the system state, which is obtained from permanent monitoring.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6449336]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>66</startPage>
			<endPage>72</endPage>
			<fileSize>1321</fileSize>
			<authors><![CDATA[Junca, M.;Sanchez-Silva, M.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Optimal Number of Repairs Before Replacement for a System Subject to Shocks of a Non-Homogeneous Pure Birth Process]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6449337]]></link>
			<description><![CDATA[We consider a system subject to shocks that arrive according to a nonhomogeneous pure birth process (NHPBP). As a shock occurs, the system has two types of failures. Type-I failure (minor failure) is rectified by a general repair, whereas type-II failure (catastrophic failure) is removed by an unplanned replacement. The probabilities of these two types of failures depend on the number of shocks since the last replacement. We consider a policy with which the system is replaced at the <i>n</i> th type-I failure, or at any type-II failure. The aim of this paper is to determine the optimal policy <i>n*</i>, the number of minor failures up to replacement that minimizes the expected cost rate of the system subject to NHPBP shocks. The model is a generalization of the existing models, and is more applicable in practice. We present some numerical examples, and show that several classical models are the special cases of our model.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6449337]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>73</startPage>
			<endPage>81</endPage>
			<fileSize>2826</fileSize>
			<authors><![CDATA[Shey-Huei Sheu;Yen-Luan Chen;Chin-Chih Chang;Zhang, Z.G.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Comparative Analysis of Optimal Maintenance Policies Under General Repair With Underlying Weibull Distributions]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6425544]]></link>
			<description><![CDATA[Various replacement policies under Kijima's general repair model with the underlying Weibull distribution function are studied via two efficient methods. The first one is based on our previously derived approximate formula for the g-renewal function; the second is an improved Monte Carlo method. These methods enable an in-depth, comparative analysis of the maintenance polices in question. An efficient algorithm is suggested for finding optimal preventive replacement times. The influence of restoration factor, including the deviation from a minimal repair assumption, on the optimal solution is studied. A practical study illustration is provided.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6425544]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>82</startPage>
			<endPage>91</endPage>
			<fileSize>1306</fileSize>
			<authors><![CDATA[Yevkin, O.;Krivtsov, V.;]]></authors>
		</item>
		<item>
			<title><![CDATA[A Novel Reliability Evaluation Technique for Stochastic-Flow Manufacturing Networks With Multiple Production Lines]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6327387]]></link>
			<description><![CDATA[This paper presents a novel technique to measure the performance of a stochastic-flow manufacturing network (SMN) which violates the so-called flow conservation law due to the failure rates of stations. We address the mission reliability, the probability of demand satisfaction, as a performance indicator for the SMN while considering both the stochastic capacities and the multiple production lines. First, we construct a manufacturing system as an SMN through a graphical transformation, and decompose the transformed SMN into several paths for further analysis. Subsequently, two algorithms for different scenarios are designed to generate all minimal capacity vectors that stations should provide to satisfy the given demand. The first scenario is for the SMN with identical production lines in parallel. The second scenario is for distinct production lines with common stations in the SMN. We derive the mission reliability in terms of minimal capacity vectors by applying the recursive sum of disjoint products (RSDP) algorithm. A decision making issue is also discussed to decide a reliable production strategy.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6327387]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>92</startPage>
			<endPage>104</endPage>
			<fileSize>2793</fileSize>
			<authors><![CDATA[Yi-Kuei Lin;Ping-Chen Chang;]]></authors>
		</item>
		<item>
			<title><![CDATA[Speeding Up the Estimation of the Expected Value of Maximum Flow Through Reliable Networks]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423859]]></link>
			<description><![CDATA[A common measure of performance of a reliable network, i.e., a network in which elements are failure prone, is the expected value of the maximum <i>s</i>-<i>t</i> flow between a pre-specified source node <i>s</i> and a pre-specified terminal node <i>t</i> in the network. The problem of determining the expected value of maximum <i>s</i>-<i>t</i> flow is computationally hard. Therefore, for practical sized networks, it is estimated through Monte Carlo based simulation methods which estimate the measure by evaluating the maximum flows in a large sample of network states. Such methods are computationally expensive. In this paper, we present an algorithm which speeds up the process of evaluating maximum flows in the sampled states by a factor of three on two difficult classes of randomly generated networks. This speed-up allows us to compute the measure for larger networks than is currently possible. It also allows us to obtain more accurate estimates on similar sized problems within similar execution times.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423859]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>105</startPage>
			<endPage>115</endPage>
			<fileSize>2152</fileSize>
			<authors><![CDATA[Sharma, M.;Ghosh, D.;]]></authors>
		</item>
		<item>
			<title><![CDATA[An Adaptive Self-Configuration Scheme for Severity Invariant Machine Fault Diagnosis]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6331595]]></link>
			<description><![CDATA[Vibration signals, used for abnormality detection in machine health monitoring (MHM), exhibit significant variation with varying fault severity. This signal variation causes overlap among the features characterizing different types of faults, which results in severe performance degradation of the fault diagnostic model. In this paper, a wavelet based adaptive training set and feature selection (WATF) self-configuration scheme is presented, which selects the optimum wavelet decomposition level, and employs adaptive selection of the training set and features. Optimal wavelet decomposition level selection is such that the maximum fault signature-signal energy bands are achieved. The severity variant features, which could cause detrimental class overlap for MHM, are avoided using adaptive selection of the training set and features based on the location of a test data in feature space. WATF uses Support Vector Machines (SVM) to build the fault diagnostic model, and its performance and robustness has been tested with data having different severity levels. Comparative studies of WATF with eight existing fault diagnosis schemes show that, for publicly available data sets, WATF achieves higher fault detection accuracy, even when training and testing data sets belong to different severity levels.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6331595]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>116</startPage>
			<endPage>126</endPage>
			<fileSize>1327</fileSize>
			<authors><![CDATA[Yaqub, M.F.;Gondal, I.;Kamruzzaman, J.;]]></authors>
		</item>
		<item>
			<title><![CDATA[A Framework of Similarity-Based Residual Life Prediction Approaches Using Degradation Histories With Failure, Preventive Maintenance, and Suspension Events]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423863]]></link>
			<description><![CDATA[This paper presents a framework of similarity-based residual life prediction (SbRLP) approaches in which historical samples that fail and do not fail (due to preventive maintenance or suspension) are both utilized. Within the framework, two solutions are proposed to estimate the lifetimes of the preventively maintained or suspended historical samples, and to utilize their degradation histories in a SbRLP approach. An extensive numerical investigation verifies the superiority of the proposed framework using Solution A over the corresponding classical SbRLP approach. In addition, the investigation results reveal that the proposed framework using Solution B is ineffective when failed historical samples are limited, but its performance improves fast with the increment of available failed historical samples. The findings in the numerical investigation suggest the use of the proposed framework using Solution A when failed historical samples are limited, and the use of the proposed framework using Solution B when abundant failed historical samples are available.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423863]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>127</startPage>
			<endPage>135</endPage>
			<fileSize>1284</fileSize>
			<authors><![CDATA[Ming-Yi You;Guang Meng;]]></authors>
		</item>
		<item>
			<title><![CDATA[Online Anomaly Detection for Hard Disk Drives Based on Mahalanobis Distance]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423861]]></link>
			<description><![CDATA[A hard disk drive (HDD) failure may cause serious data loss and catastrophic consequences. Online health monitoring provides information about the degradation trend of the HDD, and hence the early warning of failures, which gives us a chance to save the data. This paper developed an approach for HDD anomaly detection using Mahalanobis distance (MD). Critical parameters were selected using failure modes, mechanisms, and effects analysis (FMMEA), and the minimum redundancy maximum relevance (mRMR) method. A self-monitoring, analysis, and reporting technology (SMART) data set is used to evaluate the performance of the developed approach. The result shows that about 67% of the anomalies of failed drives can be detected with zero false alarm rate, and most of them can provide users with at least 20 hours during which to backup the data.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423861]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>136</startPage>
			<endPage>145</endPage>
			<fileSize>811</fileSize>
			<authors><![CDATA[Yu Wang;Qiang Miao;Ma, E.W.M.;Kwok-Leung Tsui;Pecht, M.G.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Uncertainty Quantification in Gear Remaining Useful Life Prediction Through an Integrated Prognostics Method]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423860]]></link>
			<description><![CDATA[Accurate health prognosis is critical for ensuring equipment reliability and reducing the overall life-cycle costs. The existing gear prognosis methods are primarily either model-based or data-driven. In this paper, an integrated prognostics method is developed for gear remaining life prediction, which utilizes both gear physical models and real-time condition monitoring data. The general prognosis framework for gears is proposed. The developed physical models include a gear finite element model for gear stress analysis, a gear dynamics model for dynamic load calculation, and a damage propagation model described using Paris' law. A gear mesh stiffness computation method is developed based on the gear system potential energy, which results in more realistic curved crack propagation paths. Material uncertainty and model uncertainty are considered to account for the differences among different specific units that affect the damage propagation path. A Bayesian method is used to fuse the collected condition monitoring data to update the distributions of the uncertainty factors for the current specific unit being monitored, and to achieve the updated remaining useful life prediction. An example is used to demonstrate the effectiveness of the proposed method.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423860]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>146</startPage>
			<endPage>159</endPage>
			<fileSize>2658</fileSize>
			<authors><![CDATA[Fuqiong Zhao;Zhigang Tian;Yong Zeng;]]></authors>
		</item>
		<item>
			<title><![CDATA[An Adaptive Self-Configuration Scheme for Severity Invariant Machine Fault Diagnosis]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6461121]]></link>
			<description><![CDATA[Vibration signals, used for abnormality detection in machine health monitoring (MHM), exhibit significant variation with varying fault severity. This signal variation causes overlap among the features characterizing different types of faults, which results in severe performance degradation of the fault diagnostic model. In this paper, a wavelet based adaptive training set and feature selection (WATF) self-configuration scheme is presented, which selects the optimum wavelet decomposition level, and employs adaptive selection of the training set and features. Optimal wavelet decomposition level selection is such that the maximum fault signature-signal energy bands are achieved. The severity variant features, which could cause detrimental class overlap for MHM, are avoided using adaptive selection of the training set and features based on the location of a test data in feature space. WATF uses Support Vector Machines (SVM) to build the fault diagnostic model, and its performance and robustness has been tested with data having different severity levels. Comparative studies of WATF with eight existing fault diagnosis schemes show that, for publicly available datasets, WATF achieves higher fault detection accuracy, even when training and testing datasets belong to different severity levels.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6461121]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>160</startPage>
			<endPage>170</endPage>
			<fileSize>1303</fileSize>
			<authors><![CDATA[Yaqub, M.F.;Gondal, I.;Kamruzzaman, J.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Abrasion Modeling of Multiple-Point Defect Dynamics for Machine Condition Monitoring]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6461122]]></link>
			<description><![CDATA[Multiple-point defects and abraded surfaces in rotary machinery induce complex vibration signatures, and have a tendency to mislead defect diagnosis models. A challenging problem in machine defect diagnosis is to model and study defect signature dynamics in the case of multiple-point defects and surface abrasion. In this study, a multiple-point defect model (MPDM) that characterizes the dynamics of n-point bearing defects is proposed. MPDM is further extended to model degradation in a rotating machine as a special case of multiple-point defects. Analytical and experimental results for multiple-point defects and abrasions show that the location of the fundamental defect frequency shifts depending upon the relative location of the defects and width of the abrasive region. This variation in the defect frequency results in a degradation of the defect detection accuracy of the defect diagnostic model. Based on envelope detection analysis, a modification in existing defect diagnostic models is recommended to nullify the impact of multiple-point defects, and general abrasion in machine components.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6461122]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>171</startPage>
			<endPage>182</endPage>
			<fileSize>2255</fileSize>
			<authors><![CDATA[Yaqub, M.F.;Gondal, I.;Kamruzzaman, J.;Loparo, K.A.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Multi-Sensor Information Based Remaining Useful Life Prediction With Anticipated Performance]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6425545]]></link>
			<description><![CDATA[For a class of multi-sensor dynamic systems subject to latent degradation, the remaining useful life prediction with anticipated performance is mainly considered in this paper. The hidden degradation process is first identified recursively by adopting distributed fusion filtering based on observations from multiple sensors. Then the remaining useful life distribution is predicted on the basis of converged degradation state and parameter updating during the operating process. The uncertainty index is aanalyzed to quantitatively evaluate the benefits of increasing multi-sensor information for predicted remaining useful life, and the sensor selection is also discussed for satisfying the anticipated performance such as variance. Our main results are verified by a numerical example, and a practical case study of the milling machine experiment.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6425545]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>183</startPage>
			<endPage>198</endPage>
			<fileSize>4143</fileSize>
			<authors><![CDATA[Muheng Wei;Maoyin Chen;Donghua Zhou;]]></authors>
		</item>
		<item>
			<title><![CDATA[Effect of Intrusion Detection and Response on Reliability of Cyber Physical Systems]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423246]]></link>
			<description><![CDATA[In this paper we analyze the effect of intrusion detection and response on the reliability of a cyber physical system (CPS) comprising sensors, actuators, control units, and physical objects for controlling and protecting a physical infrastructure. We develop a probability model based on stochastic Petri nets to describe the behavior of the CPS in the presence of both malicious nodes exhibiting a range of attacker behaviors, and an intrusion detection and response system (IDRS) for detecting and responding to malicious events at runtime. Our results indicate that adjusting detection and response strength in response to attacker strength and behavior detected can significantly improve the reliability of the CPS. We report numerical data for a CPS subject to persistent, random and insidious attacks with physical interpretations given.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423246]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>199</startPage>
			<endPage>210</endPage>
			<fileSize>1336</fileSize>
			<authors><![CDATA[Mitchell, R.;Chen, I.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Wavelet Shrinkage Estimation for Non-Homogeneous Poisson Process Based Software Reliability Models]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423248]]></link>
			<description><![CDATA[We develop a novel estimation approach for quantitative software reliability by means of wavelet-based technique, where the underlying software reliability model is described by a non-homogeneous Poisson process. Our approach involves some advantages over the commonly used techniques such as maximum likelihood estimation: 1) the wavelet shrinkage estimation enables us to carry out the time-series analysis with high speed and accuracy requirements; and 2) The wavelet shrinkage estimation is classified into a non-parametric estimation without specifying a parametric form of the software intensity function. We consider data-transform-based wavelet shrinkage estimation with four kinds of thresholding schemes for empirical wavelet coefficients to estimate the software intensity function. In numerical experiments with real software-fault count data, we show that our wavelet-based estimation methods can provide better goodness-of-fit performance than not only the conventional maximum likelihood estimation and least squares estimation but also the local likelihood estimation method, in many cases, in spite of their non-parametric nature. Furthermore, we investigate the predictive performance of the proposed methods by employing the so-called one-stage look-ahead prediction method, and estimate some predictive measures such as software reliability.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423248]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>211</startPage>
			<endPage>225</endPage>
			<fileSize>2582</fileSize>
			<authors><![CDATA[Xiao Xiao;Dohi, T.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Code Coverage of Adaptive Random Testing]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6449335]]></link>
			<description><![CDATA[Random testing is a basic software testing technique that can be used to assess the software reliability as well as to detect software failures. Adaptive random testing has been proposed to enhance the failure-detection capability of random testing. Previous studies have shown that adaptive random testing can use fewer test cases than random testing to detect the first software failure. In this paper, we evaluate and compare the performance of adaptive random testing and random testing from another perspective, that of code coverage. As shown in various investigations, a higher code coverage not only brings a higher failure-detection capability, but also improves the effectiveness of software reliability estimation. We conduct a series of experiments based on two categories of code coverage criteria: structure-based coverage, and fault-based coverage. Adaptive random testing can achieve higher code coverage than random testing with the same number of test cases. Our experimental results imply that, in addition to having a better failure-detection capability than random testing, adaptive random testing also delivers a higher effectiveness in assessing software reliability, and a higher confidence in the reliability of the software under test even when no failure is detected.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6449335]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>226</startPage>
			<endPage>237</endPage>
			<fileSize>1502</fileSize>
			<authors><![CDATA[Tsong Yueh Chen;Fei-Ching Kuo;Huai Liu;Wong, W.E.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Using Single Error Correction Codes to Protect Against Isolated Defects and Soft Errors]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423243]]></link>
			<description><![CDATA[Different techniques have been used to deal with defects and soft errors. Repair techniques are commonly used for defects, while error correction codes are used for soft errors. Recently, some proposals have been made to use error correction codes to deal with defects. In this paper, we analyze the impact on reliability of such approaches that use error correction codes, which in addition to soft errors can resolve defects, at the cost of reduced ability to correct soft errors. The results showed that low defect rates or small memory sizes are required to have a low impact on reliability. Additionally, a technique that can improve reliability is proposed and analyzed. The results show that our new approach can achieve a similar reliability in terms of time to failure as that of a defect free memory at the cost of a more complex decoding algorithm.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423243]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>238</startPage>
			<endPage>243</endPage>
			<fileSize>581</fileSize>
			<authors><![CDATA[Argyrides, C.;Reviriego, P.;Maestro, J.A.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Efficient Software Reliability Analysis With Correlated Component Failures]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423244]]></link>
			<description><![CDATA[Correlated component failures (COCOF) may impact the reliability of a software application, and hence these types of failures must be explicitly incorporated into reliability analysis. The influence of COCOF on application reliability must be analyzed within the context of the application architecture. Contemporary reliability analysis approaches that incorporate COCOF, however, cannot scale to even moderate-sized software applications. This paper presents an efficient, scalable approach to analyze the reliability of a component-based software system, considering COCOF within the context of its architecture. The effectiveness of the approach is illustrated through two experimental studies. The results indicate that the approach is simple and efficient, and hence can be applied to large systems to identify correlations that impede system reliability.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423244]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>244</startPage>
			<endPage>255</endPage>
			<fileSize>1806</fileSize>
			<authors><![CDATA[Fiondella, L.;Rajasekaran, S.;Gokhale, S.S.;]]></authors>
		</item>
		<item>
			<title><![CDATA[A Monte Carlo Method for Estimating Reliability Parameters of a Complex Repairable Technical System With Inter-Component Dependencies]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6451173]]></link>
			<description><![CDATA[A general model of a complex technical system is considered. The system is built of multiple two-state components which can be either operable or failed. The functioning of a component is influenced in a specific way by the other components' states, thus the components are not mutually <i>s</i>-independent. Failures occur randomly, and are handled by several repair teams. If a repair team is available when a failure occurs, then the repair (or replacement) is started immediately; otherwise the component waits in the repair queue. It is assumed that each component's time to failure is exponentially distributed, and the failure intensity depends on the other components' states. No assumption is made about the components' repair time distributions. The model's complexity makes it impossible to analytically compute the parameters of the system's failure-repair process. For this reason, the sought parameters are evaluated using a combination of Monte Carlo simulation and statistical estimation. Finding the confidence interval is a non-trivial task. The first part of the paper is theoretical; the conditions under which the failure-repair process is recurrent are given, and the confidence intervals for the sought parameters are defined. The second part has an applicable character; a commodity transport network is considered as an exemplary system with inter-component dependencies, and the algorithm estimating its reliability parameters is presented with some illustrative examples.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6451173]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>256</startPage>
			<endPage>266</endPage>
			<fileSize>2091</fileSize>
			<authors><![CDATA[Malinowski, J.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Optimal Allocation of Multistate Components in Consecutive Sliding Window Systems]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423245]]></link>
			<description><![CDATA[This paper considers a system consisting of <i>n</i> linearly ordered multistate components. Each component can have different states: from complete failure, up to perfect functioning. A performance rate is associated with each state. The system fails if in each of at least <i>m</i> consecutive overlapping groups of <i>r</i> consecutive components (windows) the sum of the performance rates of components belonging to the group is lower than a minimum allowable level. It is shown that, in the case of different components, the system reliability depends on their arrangement. The optimal arrangement problem is formulated, and a numerical tool for solving this problem is suggested. The tool uses an extended universal moment generating function technique for system reliability evaluation, and a genetic algorithm for optimization. Examples of system reliability optimization are presented.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423245]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>267</startPage>
			<endPage>275</endPage>
			<fileSize>2040</fileSize>
			<authors><![CDATA[Yanping Xiang;Levitin, G.;Yuanshun Dai;]]></authors>
		</item>
		<item>
			<title><![CDATA[Reliability and Mean Residual Life of Complex Systems With Two Dependent Components Per Element]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6451172]]></link>
			<description><![CDATA[The reliability and mean residual life of complex systems are discussed. These systems consist of <i>n</i> elements each having two <i>s</i> -dependent subcomponents. The reliability of such systems involves the distributions of bivariate order statistics, and are connected with a bivariate binomial distribution. The mean residual life function of complex systems with intact components at time <i>t</i> is also discussed. Some examples and graphical representations are given.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6451172]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>276</startPage>
			<endPage>285</endPage>
			<fileSize>2696</fileSize>
			<authors><![CDATA[Bayramoglu, I.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Multicomponent Systems With Multiplicative Aging and Dependent Failures]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6451171]]></link>
			<description><![CDATA[We extend our earlier studies of a multicomponent system accumulating damage due to a series of fatal and nonfatal shocks. The model introduces statistical dependence among the system components by associating individual shock processes with potentially overlapping subsystems made up of groupings of components. We construct an aging and statistical dependence model where damage accumulates multiplicatively with each shock. We derive a representation of the system's joint survival function, and show that the Marshall-Olkin multivariate exponential model can be obtained as a special case of this model. We propose an approach to the simulation of the performance of the system, and provide several illustrative examples. We conclude by identifying possible further extensions of this model.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6451171]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>286</startPage>
			<endPage>295</endPage>
			<fileSize>1855</fileSize>
			<authors><![CDATA[Anastasiadis, S.;Arnold, R.;Chukova, S.;Hayakawa, Y.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Assessing the Lifetime Performance Index of Exponential Products With Step-Stress Accelerated Life-Testing Data]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6450150]]></link>
			<description><![CDATA[Lifetime performance assessment has been crucial to the manufacturing industry. In practice, a lifetime performance index <i>CL</i> is used to measure the larger-the-better type quality characteristics. Accelerated life test (ALT) has often been used to yield information quickly so that the life distribution of products can be estimated. This study constructs a maximum likelihood estimator (MLE) of <i>CL</i> for exponential products based on type II right censored data from the step-stress accelerated life test (SSALT). The MLE of <i>CL</i> is then utilized to develop the hypothesis testing procedure with the given lower specification limit <i>L</i> . This new testing procedure can be easily applied to assess whether the lifetime of products meets the requirements. Finally, we give two examples to explicate the proposed testing procedures.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6450150]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>296</startPage>
			<endPage>304</endPage>
			<fileSize>1880</fileSize>
			<authors><![CDATA[Hsiu-Mei Lee;Jong-Wuu Wu;Chia-Ling Lei;]]></authors>
		</item>
		<item>
			<title><![CDATA[Heuristic Degradation Test Plans for Reliability Demonstration]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423862]]></link>
			<description><![CDATA[Reliability demonstration is an important task in the product development process. The commonly used reliability demonstration test methods include bogey test, life test, and degradation test, among which the degradation test is known to be most efficient. However, its application in industry is still limited primarily due to the lack of appropriate test plans. This paper presents heuristic reliability demonstration test plans for the products whose performance characteristics can be modeled with the Weibull distribution. In particular, the paper describes degradation models, test method, test termination rules, and the calculation of reliability and confidence interval from degradation data. The paper delineates test plan models, which are solved for optimal sample size and test time using the proposed heuristic algorithm. The algorithm results in the lowest test cost and the shortest test time for the products that are expected to pass or fail the test at a high degree of confidence. A case study is presented to illustrate the proposed method, and shows that the heuristic test plan reduced the test time, and cost by 27%, and 29%, respectively. The paper also numerically compares the three test methods, and concludes that the degradation test method is most efficient in terms of test time, cost, and sample size.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6423862]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>305</startPage>
			<endPage>311</endPage>
			<fileSize>1014</fileSize>
			<authors><![CDATA[Guangbin Yang;]]></authors>
		</item>
		<item>
			<title><![CDATA[Call for Papers - IEEE Transactions on Reliability Special Section on Trustworthy Computing]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6471784]]></link>
			<description><![CDATA[Prospective authors are requested to submit new, unpublished manuscripts for inclusion in the upcoming event described in this call for papers. Trustworthy Computing (TC) has been applied to software-enabled computing systems and networks that are inherently secure, private, available, and reliable. As the fast growing mobile cloud computing emerges to cover smart phones, tablets, smart TV, and cloud computing platforms, these ubiquitous computing devices poses new challenges to trustworthy computing. Cloud computing offers organizations of all sizes the ability to embrace and implement new applications at far less cost than traditional approaches. Organizations that move workloads to the cloud take advantage of the capabilities of their cloud providers to ensure continuous availability of services. However, the ever-growing complexity of such systems and the software that controls them not only makes it much more difficult to guarantee their quality, but also introduces more vulnerability for malicious attacks, intrusion, and data loss. To address these needs, this special section calls for novel applications of emerging techniques for trustworthy computing of information, software, systems, networks. Reviews and case studies which address state-of-art research and state-of-practice industry experiences are also welcomed.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6471784]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>312</startPage>
			<endPage>312</endPage>
			<fileSize>630</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[Call for Papers - Battery Reliability and Safety Special Section in the IEEE Transactions on Reliability]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6471786]]></link>
			<description><![CDATA[IEEE Reliability Society is pleased to announce a call for papers to be published in a special section of IEEE Transactions on Reliability with expected publication period in spring 2013, pending sufficient acceptable papers by that time. This issue will focus specifically on the challenges and technologies surrounding battery reliability and safety. The objective of this special issue is to highlight the pressing needs and potential solutions to challenges relating to battery safety and reliability. Further development of batteries for use as portable power sources and energy storage systems is regarded as a top priority for research and development. Technologies introduced over the past decade, from smaller and more powerful portable electronic devices to zero emission electric vehicles, are all indicative of the need for improved battery systems. However, the improvement of cell energy and power densities cannot come at the expense of safety, cost, and reliability. Penetration of new technologies such as electric vehicles into a traditionally fossil fuel dominated industry can be easily thwarted by claims of "lack of safety." Additionally, millions of dollars in financial losses can be incurred if a battery safety event results in a device recall. Therefore, it is important that advancements in reliability and performance run in parallel with advancements in safety. This special issue will be concerned with, but is not limited to, issues of: Battery Pack Thermal Management; Cell Thermal Modeling; Prognostics and Catastrophic Failure Pre-curser Detection; Design for Safety; Non-toxic and Environmental Friendly Next Generation Electrodes; Non-volatile Electrolytes; Safe Separators (enhanced separator shut-down); Cell Balancing; Abuse Tolerance; and Safe System Integration.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6471786]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>313</startPage>
			<endPage>313</endPage>
			<fileSize>283</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[Open Access]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6471788]]></link>
			<description><![CDATA[Advertisement: This publication offers open access options for authors. IEEE open access publishing.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6471788]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>314</startPage>
			<endPage>314</endPage>
			<fileSize>1155</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[IEEE Xplore Digital Library]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6471790]]></link>
			<description><![CDATA[Advertisement: IEEE Xplore digital library. Driving research at the world's leading universities and institutions.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6471790]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>315</startPage>
			<endPage>315</endPage>
			<fileSize>1371</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[IEEE Foundation]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6471787]]></link>
			<description><![CDATA[Advertisement: The IEEE Foundation strives to globalize technological literacy from childhood to adulthood in an effort to spread the knowledge of how technology is created and impacts society today.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6471787]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>316</startPage>
			<endPage>316</endPage>
			<fileSize>320</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[IEEE Transactions on Reliability institutional listings]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6471873]]></link>
			<description><![CDATA[The IEEE Reliability Society is grateful for the support given by the organizations listed below and invites applications for Institutional Listings from other firms interested in the field of Reliability.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6471873]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>C3</startPage>
			<endPage>C3</endPage>
			<fileSize>1054</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[IEEE Transactions on Reliability institutional listings]]></title>
			<link><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6471872]]></link>
			<description><![CDATA[The IEEE Reliability Society is grateful for the support given by the organizations listed below and invites applications for Institutional Listings from other firms interested in the field of Reliability.]]></description>
			<pubDate><![CDATA[March  2013]]></pubDate>
			<guid><![CDATA[http://null/xpl/articleDetails.jsp?arnumber=6471872]]></guid>
			<volume>62</volume>
			<issue>1</issue>
			<startPage>C4</startPage>
			<endPage>C4</endPage>
			<fileSize>1108</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
	</channel>
</rss>